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    Thermoelastic Solutions for a Semi-Infinite Substrate With a Powered Electronic Device 

    Source: Journal of Electronic Packaging:;1992:;volume( 114 ):;issue: 003:;page 353
    Author(s): John H. Lau
    Publisher: The American Society of Mechanical Engineers (ASME)
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    Bending and Twisting of 60Sn40Pb Solder Interconnects With Creep 

    Source: Journal of Electronic Packaging:;1994:;volume( 116 ):;issue: 002:;page 154
    Author(s): John H. Lau
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: An exact analysis is presented for the creep deformation of a thin-walled circular solder cylinder under the actions of bending and twisting moments. Dimensionless interaction curves and charts ...
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    On Murphy’s Integrated Circuit Yield Integral 

    Source: Journal of Electronic Packaging:;1995:;volume( 117 ):;issue: 002:;page 159
    Author(s): John H. Lau
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: An approximated closed-form integrated circuit (IC) yield formula based on a Gaussian defect density distribution for the compounder in Murphy’s yield integral is presented. Also, a closed-form ...
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    Reliability of Lead-Free Solder Joints 

    Source: Journal of Electronic Packaging:;2006:;volume( 128 ):;issue: 003:;page 297
    Author(s): John H. Lau
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Reliability of the restriction of the use of certain hazardous substances in electrical and electronic equipment compliant products is investigated in this study. Emphasis is placed on the ...
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    Thermal Stress and Strain in Microelectronics Packaging 

    Source: Journal of Electronic Packaging:;1993:;volume( 115 ):;issue: 003:;page 343
    Author(s): John H. Lau; Peter A. Engel
    Publisher: The American Society of Mechanical Engineers (ASME)
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    Handbook of Tape Automated Bonding 

    Source: Journal of Electronic Packaging:;1992:;volume( 114 ):;issue: 004:;page 480
    Author(s): John H. Lau; William T. Chen
    Publisher: The American Society of Mechanical Engineers (ASME)
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    Chip on Board: Technologies for Multichip Modules 

    Source: Journal of Electronic Packaging:;1995:;volume( 117 ):;issue: 002:;page 165
    Author(s): John H. Lau; Richard J. Prosman
    Publisher: The American Society of Mechanical Engineers (ASME)
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    Temperature-Dependent Popcorning Analysis of Plastic Ball Grid Array Package During Solder Reflow With Fracture Mechanics Method 

    Source: Journal of Electronic Packaging:;2000:;volume( 122 ):;issue: 001:;page 34
    Author(s): John H. Lau; S. W. Ricky Lee
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: The popcorning effect of plastic ball grid array (PBGA) packages is analyzed using the method of fracture mechanics. The following three specific problems are studied: (1) crack initiation in ...
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    Solder Joint Reliability—Theory and Applications 

    Source: Journal of Electronic Packaging:;1992:;volume( 114 ):;issue: 001:;page 100
    Author(s): John H. Lau; Peter A. Engel
    Publisher: The American Society of Mechanical Engineers (ASME)
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    3D Nonlinear Stress Analysis of Tin Whisker Initiation on Lead-Free Components 

    Source: Journal of Electronic Packaging:;2003:;volume( 125 ):;issue: 004:;page 621
    Author(s): John H. Lau; Stephen H. Pan
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: In this study, a three-dimensional (3D) nonlinear stress analysis of the tin whisker initiation on a pure matte Sn-plated copper substrate is investigated. The structure is subjected to a ...
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