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    Temperature-Dependent Popcorning Analysis of Plastic Ball Grid Array Package During Solder Reflow With Fracture Mechanics Method

    Source: Journal of Electronic Packaging:;2000:;volume( 122 ):;issue: 001::page 34
    Author:
    John H. Lau
    ,
    S. W. Ricky Lee
    DOI: 10.1115/1.483129
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: The popcorning effect of plastic ball grid array (PBGA) packages is analyzed using the method of fracture mechanics. The following three specific problems are studied: (1) crack initiation in the die attach of the package, (2) crack growth in the die attach, and (3) crack growth at the interface between the solder mask and copper. Two different methods (crack tip opening displacement and virtual crack closure technique) are used to determine the crack-tip parameters such as the strain energy release rate, stress intensity factors, and phase angle for different crack lengths and temperatures. [S1043-7398(00)00401-1]
    keyword(s): Thermal expansion , Fracture mechanics , Temperature , Copper , Solders , Stress , Fracture (Materials) , Masks , Reflow soldering , Ball-Grid-Array packaging AND Pressure ,
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      Temperature-Dependent Popcorning Analysis of Plastic Ball Grid Array Package During Solder Reflow With Fracture Mechanics Method

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    http://yetl.yabesh.ir/yetl1/handle/yetl/123574
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    • Journal of Electronic Packaging

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    contributor authorJohn H. Lau
    contributor authorS. W. Ricky Lee
    date accessioned2017-05-09T00:02:13Z
    date available2017-05-09T00:02:13Z
    date copyrightMarch, 2000
    date issued2000
    identifier issn1528-9044
    identifier otherJEPAE4-26178#34_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/123574
    description abstractThe popcorning effect of plastic ball grid array (PBGA) packages is analyzed using the method of fracture mechanics. The following three specific problems are studied: (1) crack initiation in the die attach of the package, (2) crack growth in the die attach, and (3) crack growth at the interface between the solder mask and copper. Two different methods (crack tip opening displacement and virtual crack closure technique) are used to determine the crack-tip parameters such as the strain energy release rate, stress intensity factors, and phase angle for different crack lengths and temperatures. [S1043-7398(00)00401-1]
    publisherThe American Society of Mechanical Engineers (ASME)
    titleTemperature-Dependent Popcorning Analysis of Plastic Ball Grid Array Package During Solder Reflow With Fracture Mechanics Method
    typeJournal Paper
    journal volume122
    journal issue1
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.483129
    journal fristpage34
    journal lastpage41
    identifier eissn1043-7398
    keywordsThermal expansion
    keywordsFracture mechanics
    keywordsTemperature
    keywordsCopper
    keywordsSolders
    keywordsStress
    keywordsFracture (Materials)
    keywordsMasks
    keywordsReflow soldering
    keywordsBall-Grid-Array packaging AND Pressure
    treeJournal of Electronic Packaging:;2000:;volume( 122 ):;issue: 001
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
    yabeshDSpacePersian