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contributor authorJohn H. Lau
contributor authorS. W. Ricky Lee
date accessioned2017-05-09T00:02:13Z
date available2017-05-09T00:02:13Z
date copyrightMarch, 2000
date issued2000
identifier issn1528-9044
identifier otherJEPAE4-26178#34_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/123574
description abstractThe popcorning effect of plastic ball grid array (PBGA) packages is analyzed using the method of fracture mechanics. The following three specific problems are studied: (1) crack initiation in the die attach of the package, (2) crack growth in the die attach, and (3) crack growth at the interface between the solder mask and copper. Two different methods (crack tip opening displacement and virtual crack closure technique) are used to determine the crack-tip parameters such as the strain energy release rate, stress intensity factors, and phase angle for different crack lengths and temperatures. [S1043-7398(00)00401-1]
publisherThe American Society of Mechanical Engineers (ASME)
titleTemperature-Dependent Popcorning Analysis of Plastic Ball Grid Array Package During Solder Reflow With Fracture Mechanics Method
typeJournal Paper
journal volume122
journal issue1
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.483129
journal fristpage34
journal lastpage41
identifier eissn1043-7398
keywordsThermal expansion
keywordsFracture mechanics
keywordsTemperature
keywordsCopper
keywordsSolders
keywordsStress
keywordsFracture (Materials)
keywordsMasks
keywordsReflow soldering
keywordsBall-Grid-Array packaging AND Pressure
treeJournal of Electronic Packaging:;2000:;volume( 122 ):;issue: 001
contenttypeFulltext


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