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    Surface Profilometry Based on Fringing Capacitance Measurement

    Source: Journal of Dynamic Systems, Measurement, and Control:;1985:;volume( 107 ):;issue: 003::page 192
    Author:
    J. L. Garbini
    ,
    L. J. Albrecht
    ,
    J. E. Jorgensen
    ,
    G. F. Mauer
    DOI: 10.1115/1.3140720
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: A rugged, compact sensor for in-process measurement of surface finish profiles is proposed. The concept is based on the detection of variations in the fringe electric field generated between the surface and a perpendicular, ceramic-encased electrode. An analysis of both static and spatial dynamic characteristics of this “capacitive profilometer” is presented. For some surfaces, the device acts as a low-pass spatial filter, attenuating the higher spatial frequencies. A method of dynamic compensation, based on Fourier transform techniques, is developed. Experimental results demonstrate the validity of the analysis and dynamic compensation. Direct comparisons of surface profiles measured with the capacitive and standard stylus-type are presented and show good agreement.
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      Surface Profilometry Based on Fringing Capacitance Measurement

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    http://yetl.yabesh.ir/yetl1/handle/yetl/99591
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    contributor authorJ. L. Garbini
    contributor authorL. J. Albrecht
    contributor authorJ. E. Jorgensen
    contributor authorG. F. Mauer
    date accessioned2017-05-08T23:19:48Z
    date available2017-05-08T23:19:48Z
    date copyrightSeptember, 1985
    date issued1985
    identifier issn0022-0434
    identifier otherJDSMAA-26088#192_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/99591
    description abstractA rugged, compact sensor for in-process measurement of surface finish profiles is proposed. The concept is based on the detection of variations in the fringe electric field generated between the surface and a perpendicular, ceramic-encased electrode. An analysis of both static and spatial dynamic characteristics of this “capacitive profilometer” is presented. For some surfaces, the device acts as a low-pass spatial filter, attenuating the higher spatial frequencies. A method of dynamic compensation, based on Fourier transform techniques, is developed. Experimental results demonstrate the validity of the analysis and dynamic compensation. Direct comparisons of surface profiles measured with the capacitive and standard stylus-type are presented and show good agreement.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleSurface Profilometry Based on Fringing Capacitance Measurement
    typeJournal Paper
    journal volume107
    journal issue3
    journal titleJournal of Dynamic Systems, Measurement, and Control
    identifier doi10.1115/1.3140720
    journal fristpage192
    journal lastpage199
    identifier eissn1528-9028
    treeJournal of Dynamic Systems, Measurement, and Control:;1985:;volume( 107 ):;issue: 003
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
    yabeshDSpacePersian