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contributor authorJ. L. Garbini
contributor authorL. J. Albrecht
contributor authorJ. E. Jorgensen
contributor authorG. F. Mauer
date accessioned2017-05-08T23:19:48Z
date available2017-05-08T23:19:48Z
date copyrightSeptember, 1985
date issued1985
identifier issn0022-0434
identifier otherJDSMAA-26088#192_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/99591
description abstractA rugged, compact sensor for in-process measurement of surface finish profiles is proposed. The concept is based on the detection of variations in the fringe electric field generated between the surface and a perpendicular, ceramic-encased electrode. An analysis of both static and spatial dynamic characteristics of this “capacitive profilometer” is presented. For some surfaces, the device acts as a low-pass spatial filter, attenuating the higher spatial frequencies. A method of dynamic compensation, based on Fourier transform techniques, is developed. Experimental results demonstrate the validity of the analysis and dynamic compensation. Direct comparisons of surface profiles measured with the capacitive and standard stylus-type are presented and show good agreement.
publisherThe American Society of Mechanical Engineers (ASME)
titleSurface Profilometry Based on Fringing Capacitance Measurement
typeJournal Paper
journal volume107
journal issue3
journal titleJournal of Dynamic Systems, Measurement, and Control
identifier doi10.1115/1.3140720
journal fristpage192
journal lastpage199
identifier eissn1528-9028
treeJournal of Dynamic Systems, Measurement, and Control:;1985:;volume( 107 ):;issue: 003
contenttypeFulltext


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