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    Design Optimization by Virtual Prototyping Using Numerical Simulation to Ensure Thermomechanical Reliability in the Assembly and Interconnection of Electronic Assemblies

    Source: Journal of Electronic Packaging:;2022:;volume( 145 ):;issue: 001::page 11107-1
    Author:
    Döring, Ralf
    ,
    Dudek, R.
    ,
    Rzepka, S.
    ,
    Scheiter, L.
    ,
    Noack, E.
    ,
    Seiler, B.
    DOI: 10.1115/1.4056445
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: A methodology is presented that allows the evaluation of the thermomechanical reliability of electronic packages using “virtual prototyping.” Here, a virtual flip chip ball grid array (FC-BGA) is examined in comparison to a reference chip scale package (CSP). The comparison is performed using finite element simulation. A combined measurement-simulation technique is used to calibrate the finite element simulations on a reference object. The adjustment is based on the in-plane deformation field obtained by both simulation and optical measurement. For the latter, an optical sensor is used for in-plane deformation and strain field analysis based on the gray-scale correlation method. The findings obtained can be extrapolated to alternative package types with different but similar design to evaluate their suitability for the desired application before physical fabrication.
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      Design Optimization by Virtual Prototyping Using Numerical Simulation to Ensure Thermomechanical Reliability in the Assembly and Interconnection of Electronic Assemblies

    URI
    http://yetl.yabesh.ir/yetl1/handle/yetl/4291698
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    • Journal of Electronic Packaging

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    contributor authorDöring, Ralf
    contributor authorDudek, R.
    contributor authorRzepka, S.
    contributor authorScheiter, L.
    contributor authorNoack, E.
    contributor authorSeiler, B.
    date accessioned2023-08-16T18:14:47Z
    date available2023-08-16T18:14:47Z
    date copyright12/23/2022 12:00:00 AM
    date issued2022
    identifier issn1043-7398
    identifier otherep_145_01_011107.pdf
    identifier urihttp://yetl.yabesh.ir/yetl1/handle/yetl/4291698
    description abstractA methodology is presented that allows the evaluation of the thermomechanical reliability of electronic packages using “virtual prototyping.” Here, a virtual flip chip ball grid array (FC-BGA) is examined in comparison to a reference chip scale package (CSP). The comparison is performed using finite element simulation. A combined measurement-simulation technique is used to calibrate the finite element simulations on a reference object. The adjustment is based on the in-plane deformation field obtained by both simulation and optical measurement. For the latter, an optical sensor is used for in-plane deformation and strain field analysis based on the gray-scale correlation method. The findings obtained can be extrapolated to alternative package types with different but similar design to evaluate their suitability for the desired application before physical fabrication.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleDesign Optimization by Virtual Prototyping Using Numerical Simulation to Ensure Thermomechanical Reliability in the Assembly and Interconnection of Electronic Assemblies
    typeJournal Paper
    journal volume145
    journal issue1
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.4056445
    journal fristpage11107-1
    journal lastpage11107-6
    page6
    treeJournal of Electronic Packaging:;2022:;volume( 145 ):;issue: 001
    contenttypeFulltext
    DSpace software copyright © 2002-2015  DuraSpace
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    yabeshDSpacePersian
     
    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
    yabeshDSpacePersian