| contributor author | Döring, Ralf | |
| contributor author | Dudek, R. | |
| contributor author | Rzepka, S. | |
| contributor author | Scheiter, L. | |
| contributor author | Noack, E. | |
| contributor author | Seiler, B. | |
| date accessioned | 2023-08-16T18:14:47Z | |
| date available | 2023-08-16T18:14:47Z | |
| date copyright | 12/23/2022 12:00:00 AM | |
| date issued | 2022 | |
| identifier issn | 1043-7398 | |
| identifier other | ep_145_01_011107.pdf | |
| identifier uri | http://yetl.yabesh.ir/yetl1/handle/yetl/4291698 | |
| description abstract | A methodology is presented that allows the evaluation of the thermomechanical reliability of electronic packages using “virtual prototyping.” Here, a virtual flip chip ball grid array (FC-BGA) is examined in comparison to a reference chip scale package (CSP). The comparison is performed using finite element simulation. A combined measurement-simulation technique is used to calibrate the finite element simulations on a reference object. The adjustment is based on the in-plane deformation field obtained by both simulation and optical measurement. For the latter, an optical sensor is used for in-plane deformation and strain field analysis based on the gray-scale correlation method. The findings obtained can be extrapolated to alternative package types with different but similar design to evaluate their suitability for the desired application before physical fabrication. | |
| publisher | The American Society of Mechanical Engineers (ASME) | |
| title | Design Optimization by Virtual Prototyping Using Numerical Simulation to Ensure Thermomechanical Reliability in the Assembly and Interconnection of Electronic Assemblies | |
| type | Journal Paper | |
| journal volume | 145 | |
| journal issue | 1 | |
| journal title | Journal of Electronic Packaging | |
| identifier doi | 10.1115/1.4056445 | |
| journal fristpage | 11107-1 | |
| journal lastpage | 11107-6 | |
| page | 6 | |
| tree | Journal of Electronic Packaging:;2022:;volume( 145 ):;issue: 001 | |
| contenttype | Fulltext | |