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contributor authorDöring, Ralf
contributor authorDudek, R.
contributor authorRzepka, S.
contributor authorScheiter, L.
contributor authorNoack, E.
contributor authorSeiler, B.
date accessioned2023-08-16T18:14:47Z
date available2023-08-16T18:14:47Z
date copyright12/23/2022 12:00:00 AM
date issued2022
identifier issn1043-7398
identifier otherep_145_01_011107.pdf
identifier urihttp://yetl.yabesh.ir/yetl1/handle/yetl/4291698
description abstractA methodology is presented that allows the evaluation of the thermomechanical reliability of electronic packages using “virtual prototyping.” Here, a virtual flip chip ball grid array (FC-BGA) is examined in comparison to a reference chip scale package (CSP). The comparison is performed using finite element simulation. A combined measurement-simulation technique is used to calibrate the finite element simulations on a reference object. The adjustment is based on the in-plane deformation field obtained by both simulation and optical measurement. For the latter, an optical sensor is used for in-plane deformation and strain field analysis based on the gray-scale correlation method. The findings obtained can be extrapolated to alternative package types with different but similar design to evaluate their suitability for the desired application before physical fabrication.
publisherThe American Society of Mechanical Engineers (ASME)
titleDesign Optimization by Virtual Prototyping Using Numerical Simulation to Ensure Thermomechanical Reliability in the Assembly and Interconnection of Electronic Assemblies
typeJournal Paper
journal volume145
journal issue1
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.4056445
journal fristpage11107-1
journal lastpage11107-6
page6
treeJournal of Electronic Packaging:;2022:;volume( 145 ):;issue: 001
contenttypeFulltext


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