Accelerated Vibration Reliability Testing of Electronic Assemblies Using Sine Dwell With Resonance TrackingSource: Journal of Electronic Packaging:;2018:;volume( 140 ):;issue: 004::page 41004Author:Su, Quang T.
,
Gharaibeh, Mohammad A.
,
Stewart, Aaron J.
,
Pitarresi, James M.
,
Anselm, Martin K.
DOI: 10.1115/1.4040923Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: In this work, a sinusoidal vibration test method with resonance tracking is employed for reliability testing of circuit assemblies. The system continuously monitors for changes in the resonant frequency of the circuit board and adjusts the excitation frequency to match the resonant frequency. The test setup includes an electrodynamic shaker with a real-time vibration control, resistance monitoring for identifying electrical failures of interconnects, and vibration logging for monitoring changes in the dynamic response of the assembly over time. Reliability tests were performed using the resonance tracking sinusoidal test method for assemblies, each consisting of a centrally mounted ball grid array (BGA) device assembled with 63Sn37Pb and SAC105 solder alloys. These tests show that the resonance tracking method gives more consistent failure times. Failure analysis for the tested devices shows the primary failure mode is “input” trace crack first, followed by fatigue through the solder for complete failure. A finite element (FE) model, correlated with experimental modal analysis, is shown to accurately estimate the circuit board deflection estimated from the harmonic vibration data. This provides a means of estimating the stresses in the electronic interconnections while accounting for the variability between test parts. These fine-tuned vibration measurement techniques and related FE models provide the building blocks for high cycle solder fatigue plots (i.e., S–N curves).
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contributor author | Su, Quang T. | |
contributor author | Gharaibeh, Mohammad A. | |
contributor author | Stewart, Aaron J. | |
contributor author | Pitarresi, James M. | |
contributor author | Anselm, Martin K. | |
date accessioned | 2019-02-28T11:14:21Z | |
date available | 2019-02-28T11:14:21Z | |
date copyright | 8/20/2018 12:00:00 AM | |
date issued | 2018 | |
identifier issn | 1043-7398 | |
identifier other | ep_140_04_041004.pdf | |
identifier uri | http://yetl.yabesh.ir/yetl1/handle/yetl/4254175 | |
description abstract | In this work, a sinusoidal vibration test method with resonance tracking is employed for reliability testing of circuit assemblies. The system continuously monitors for changes in the resonant frequency of the circuit board and adjusts the excitation frequency to match the resonant frequency. The test setup includes an electrodynamic shaker with a real-time vibration control, resistance monitoring for identifying electrical failures of interconnects, and vibration logging for monitoring changes in the dynamic response of the assembly over time. Reliability tests were performed using the resonance tracking sinusoidal test method for assemblies, each consisting of a centrally mounted ball grid array (BGA) device assembled with 63Sn37Pb and SAC105 solder alloys. These tests show that the resonance tracking method gives more consistent failure times. Failure analysis for the tested devices shows the primary failure mode is “input” trace crack first, followed by fatigue through the solder for complete failure. A finite element (FE) model, correlated with experimental modal analysis, is shown to accurately estimate the circuit board deflection estimated from the harmonic vibration data. This provides a means of estimating the stresses in the electronic interconnections while accounting for the variability between test parts. These fine-tuned vibration measurement techniques and related FE models provide the building blocks for high cycle solder fatigue plots (i.e., S–N curves). | |
publisher | The American Society of Mechanical Engineers (ASME) | |
title | Accelerated Vibration Reliability Testing of Electronic Assemblies Using Sine Dwell With Resonance Tracking | |
type | Journal Paper | |
journal volume | 140 | |
journal issue | 4 | |
journal title | Journal of Electronic Packaging | |
identifier doi | 10.1115/1.4040923 | |
journal fristpage | 41004 | |
journal lastpage | 041004-9 | |
tree | Journal of Electronic Packaging:;2018:;volume( 140 ):;issue: 004 | |
contenttype | Fulltext |