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contributor authorSu, Quang T.
contributor authorGharaibeh, Mohammad A.
contributor authorStewart, Aaron J.
contributor authorPitarresi, James M.
contributor authorAnselm, Martin K.
date accessioned2019-02-28T11:14:21Z
date available2019-02-28T11:14:21Z
date copyright8/20/2018 12:00:00 AM
date issued2018
identifier issn1043-7398
identifier otherep_140_04_041004.pdf
identifier urihttp://yetl.yabesh.ir/yetl1/handle/yetl/4254175
description abstractIn this work, a sinusoidal vibration test method with resonance tracking is employed for reliability testing of circuit assemblies. The system continuously monitors for changes in the resonant frequency of the circuit board and adjusts the excitation frequency to match the resonant frequency. The test setup includes an electrodynamic shaker with a real-time vibration control, resistance monitoring for identifying electrical failures of interconnects, and vibration logging for monitoring changes in the dynamic response of the assembly over time. Reliability tests were performed using the resonance tracking sinusoidal test method for assemblies, each consisting of a centrally mounted ball grid array (BGA) device assembled with 63Sn37Pb and SAC105 solder alloys. These tests show that the resonance tracking method gives more consistent failure times. Failure analysis for the tested devices shows the primary failure mode is “input” trace crack first, followed by fatigue through the solder for complete failure. A finite element (FE) model, correlated with experimental modal analysis, is shown to accurately estimate the circuit board deflection estimated from the harmonic vibration data. This provides a means of estimating the stresses in the electronic interconnections while accounting for the variability between test parts. These fine-tuned vibration measurement techniques and related FE models provide the building blocks for high cycle solder fatigue plots (i.e., S–N curves).
publisherThe American Society of Mechanical Engineers (ASME)
titleAccelerated Vibration Reliability Testing of Electronic Assemblies Using Sine Dwell With Resonance Tracking
typeJournal Paper
journal volume140
journal issue4
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.4040923
journal fristpage41004
journal lastpage041004-9
treeJournal of Electronic Packaging:;2018:;volume( 140 ):;issue: 004
contenttypeFulltext


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