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    Stress–Strain Behavior of SAC305 at High Strain Rates

    Source: Journal of Electronic Packaging:;2015:;volume( 137 ):;issue: 001::page 11010
    Author:
    Lall, Pradeep
    ,
    Shantaram, Sandeep
    ,
    Suhling, Jeff
    ,
    Locker, David
    DOI: 10.1115/1.4028641
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Electronic products are subjected to high Glevels during mechanical shock and vibration. Failuremodes include solderjoint failures, pad cratering, chipcracking, copper trace fracture, and underfill fillet failures. The secondlevel interconnects may be experience high strain rates and accrue damage during repetitive exposure to mechanical shock. Industry migration to leadfree solders has resulted in proliferation of a wide variety of solder alloy compositions. One of the popular tinsilvercopper alloys is Sn3Ag0.5Cu. The high strain rate properties of leadfree solder alloys are scarce. Typical material tests systems are not well suited for measurement of high strain rates typical of mechanical shock. Previously, high strain rates techniques such as the split Hopkinson pressure bar (SHPB) can be used for strain rates of 1000 s−1. However, measurement of materials at strain rates of 1–100 s−1 which are typical of mechanical shock is difficult to address. In this paper, a new testtechnique developed by the authors has been presented for measurement of material constitutive behavior. The instrument enables attaining strain rates in the neighborhood of 1–100 s−1. Highspeed cameras operating at 300,000 fps have been used in conjunction with digital image correlation (DIC) for the measurement of fullfield strain during the test. Constancy of crosshead velocity has been demonstrated during the test from the unloaded state to the specimen failure. Solder alloy constitutive behavior has been measured for SAC305 solder. Constitutive model has been fit to the material data. Samples have been tested at various time under thermal aging at 25 آ°C and 125 آ°C. The constitutive model has been embedded into an explicit finite element framework for the purpose of lifeprediction of leadfree interconnects. Test assemblies has been fabricated and tested under Joint Electron Device Engineering Council (JEDEC) JESD22B111 specified condition for mechanical shock. Model predictions have been correlated with experimental data.
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      Stress–Strain Behavior of SAC305 at High Strain Rates

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    http://yetl.yabesh.ir/yetl1/handle/yetl/157671
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    contributor authorLall, Pradeep
    contributor authorShantaram, Sandeep
    contributor authorSuhling, Jeff
    contributor authorLocker, David
    date accessioned2017-05-09T01:16:55Z
    date available2017-05-09T01:16:55Z
    date issued2015
    identifier issn1528-9044
    identifier otherep_137_01_011010.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/157671
    description abstractElectronic products are subjected to high Glevels during mechanical shock and vibration. Failuremodes include solderjoint failures, pad cratering, chipcracking, copper trace fracture, and underfill fillet failures. The secondlevel interconnects may be experience high strain rates and accrue damage during repetitive exposure to mechanical shock. Industry migration to leadfree solders has resulted in proliferation of a wide variety of solder alloy compositions. One of the popular tinsilvercopper alloys is Sn3Ag0.5Cu. The high strain rate properties of leadfree solder alloys are scarce. Typical material tests systems are not well suited for measurement of high strain rates typical of mechanical shock. Previously, high strain rates techniques such as the split Hopkinson pressure bar (SHPB) can be used for strain rates of 1000 s−1. However, measurement of materials at strain rates of 1–100 s−1 which are typical of mechanical shock is difficult to address. In this paper, a new testtechnique developed by the authors has been presented for measurement of material constitutive behavior. The instrument enables attaining strain rates in the neighborhood of 1–100 s−1. Highspeed cameras operating at 300,000 fps have been used in conjunction with digital image correlation (DIC) for the measurement of fullfield strain during the test. Constancy of crosshead velocity has been demonstrated during the test from the unloaded state to the specimen failure. Solder alloy constitutive behavior has been measured for SAC305 solder. Constitutive model has been fit to the material data. Samples have been tested at various time under thermal aging at 25 آ°C and 125 آ°C. The constitutive model has been embedded into an explicit finite element framework for the purpose of lifeprediction of leadfree interconnects. Test assemblies has been fabricated and tested under Joint Electron Device Engineering Council (JEDEC) JESD22B111 specified condition for mechanical shock. Model predictions have been correlated with experimental data.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleStress–Strain Behavior of SAC305 at High Strain Rates
    typeJournal Paper
    journal volume137
    journal issue1
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.4028641
    journal fristpage11010
    journal lastpage11010
    identifier eissn1043-7398
    treeJournal of Electronic Packaging:;2015:;volume( 137 ):;issue: 001
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
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