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contributor authorLall, Pradeep
contributor authorShantaram, Sandeep
contributor authorSuhling, Jeff
contributor authorLocker, David
date accessioned2017-05-09T01:16:55Z
date available2017-05-09T01:16:55Z
date issued2015
identifier issn1528-9044
identifier otherep_137_01_011010.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/157671
description abstractElectronic products are subjected to high Glevels during mechanical shock and vibration. Failuremodes include solderjoint failures, pad cratering, chipcracking, copper trace fracture, and underfill fillet failures. The secondlevel interconnects may be experience high strain rates and accrue damage during repetitive exposure to mechanical shock. Industry migration to leadfree solders has resulted in proliferation of a wide variety of solder alloy compositions. One of the popular tinsilvercopper alloys is Sn3Ag0.5Cu. The high strain rate properties of leadfree solder alloys are scarce. Typical material tests systems are not well suited for measurement of high strain rates typical of mechanical shock. Previously, high strain rates techniques such as the split Hopkinson pressure bar (SHPB) can be used for strain rates of 1000 s−1. However, measurement of materials at strain rates of 1–100 s−1 which are typical of mechanical shock is difficult to address. In this paper, a new testtechnique developed by the authors has been presented for measurement of material constitutive behavior. The instrument enables attaining strain rates in the neighborhood of 1–100 s−1. Highspeed cameras operating at 300,000 fps have been used in conjunction with digital image correlation (DIC) for the measurement of fullfield strain during the test. Constancy of crosshead velocity has been demonstrated during the test from the unloaded state to the specimen failure. Solder alloy constitutive behavior has been measured for SAC305 solder. Constitutive model has been fit to the material data. Samples have been tested at various time under thermal aging at 25 آ°C and 125 آ°C. The constitutive model has been embedded into an explicit finite element framework for the purpose of lifeprediction of leadfree interconnects. Test assemblies has been fabricated and tested under Joint Electron Device Engineering Council (JEDEC) JESD22B111 specified condition for mechanical shock. Model predictions have been correlated with experimental data.
publisherThe American Society of Mechanical Engineers (ASME)
titleStress–Strain Behavior of SAC305 at High Strain Rates
typeJournal Paper
journal volume137
journal issue1
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.4028641
journal fristpage11010
journal lastpage11010
identifier eissn1043-7398
treeJournal of Electronic Packaging:;2015:;volume( 137 ):;issue: 001
contenttypeFulltext


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