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    Thermal Investigations of Integrated Circuits and Systems, THERMINIC'09

    Source: Journal of Electronic Packaging:;2011:;volume( 133 ):;issue: 001::page 10301
    Author:
    Marta Rencz
    DOI: 10.1115/1.3565444
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Microelectronics thermal experts from four continents met in the fall of 2009 at the 15th THERMINIC Workshop in Leuven, Belgium. The event was sponsored by the IEEE Computer Society Test Technology Technical Council and the CMP Laboratory, in cooperation with the IEEE Components, Packaging, and Manufacturing Technology Society, and the European Test Technology Technical Committee. The Workshop had participants from 25 countries.
    keyword(s): Integrated circuits ,
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      Thermal Investigations of Integrated Circuits and Systems, THERMINIC'09

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    http://yetl.yabesh.ir/yetl1/handle/yetl/145815
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    contributor authorMarta Rencz
    date accessioned2017-05-09T00:43:13Z
    date available2017-05-09T00:43:13Z
    date copyrightMarch, 2011
    date issued2011
    identifier issn1528-9044
    identifier otherJEPAE4-26312#010301_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/145815
    description abstractMicroelectronics thermal experts from four continents met in the fall of 2009 at the 15th THERMINIC Workshop in Leuven, Belgium. The event was sponsored by the IEEE Computer Society Test Technology Technical Council and the CMP Laboratory, in cooperation with the IEEE Components, Packaging, and Manufacturing Technology Society, and the European Test Technology Technical Committee. The Workshop had participants from 25 countries.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleThermal Investigations of Integrated Circuits and Systems, THERMINIC'09
    typeJournal Paper
    journal volume133
    journal issue1
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.3565444
    journal fristpage10301
    identifier eissn1043-7398
    keywordsIntegrated circuits
    treeJournal of Electronic Packaging:;2011:;volume( 133 ):;issue: 001
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
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