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    Low Temperature Solid State Gold Bonding of Si Chips to Alumina Substrates

    Source: Journal of Electronic Packaging:;2011:;volume( 133 ):;issue: 002::page 21003
    Author:
    Chu-Hsuan Sha
    ,
    Chin C. Lee
    DOI: 10.1115/1.4003868
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Pure gold (Au) is used as a bonding medium to bond silicon (Si) chips to alumina substrates. The bonding process is performed at 260 °C with only 150 psi (1.0 MPa) static pressure applied. This is a solid-state bonding without any molten phase involved. The Au layer plated on alumina is ductile enough to deform for its surface to mate with the thin Au layer coated on Si. Au atoms on both sides of the bond line are brought within atomic distance and bonding is achieved. The ductile Au joint also accommodates the significant mismatch in coefficient of thermal expansion (CTE) between Si and alumina. Scanning electron microscope (SEM) evaluations show that nearly perfect joints are achieved and no voids are observed. Five samples are shear tested. They all pass the MIL-STD-883G standard. This bonding technique can be applied to bonding any two objects that can be coated with smooth Au layers. The 260 °C bonding temperature is compatible with typical reflow temperature of Sn3.5Ag solders used in electronic industries.
    keyword(s): Bonding , Silicon chips , Pressure , Shear (Mechanics) , Low temperature AND Temperature ,
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      Low Temperature Solid State Gold Bonding of Si Chips to Alumina Substrates

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    http://yetl.yabesh.ir/yetl1/handle/yetl/145808
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    contributor authorChu-Hsuan Sha
    contributor authorChin C. Lee
    date accessioned2017-05-09T00:43:12Z
    date available2017-05-09T00:43:12Z
    date copyrightJune, 2011
    date issued2011
    identifier issn1528-9044
    identifier otherJEPAE4-26313#021003_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/145808
    description abstractPure gold (Au) is used as a bonding medium to bond silicon (Si) chips to alumina substrates. The bonding process is performed at 260 °C with only 150 psi (1.0 MPa) static pressure applied. This is a solid-state bonding without any molten phase involved. The Au layer plated on alumina is ductile enough to deform for its surface to mate with the thin Au layer coated on Si. Au atoms on both sides of the bond line are brought within atomic distance and bonding is achieved. The ductile Au joint also accommodates the significant mismatch in coefficient of thermal expansion (CTE) between Si and alumina. Scanning electron microscope (SEM) evaluations show that nearly perfect joints are achieved and no voids are observed. Five samples are shear tested. They all pass the MIL-STD-883G standard. This bonding technique can be applied to bonding any two objects that can be coated with smooth Au layers. The 260 °C bonding temperature is compatible with typical reflow temperature of Sn3.5Ag solders used in electronic industries.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleLow Temperature Solid State Gold Bonding of Si Chips to Alumina Substrates
    typeJournal Paper
    journal volume133
    journal issue2
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.4003868
    journal fristpage21003
    identifier eissn1043-7398
    keywordsBonding
    keywordsSilicon chips
    keywordsPressure
    keywordsShear (Mechanics)
    keywordsLow temperature AND Temperature
    treeJournal of Electronic Packaging:;2011:;volume( 133 ):;issue: 002
    contenttypeFulltext
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