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contributor authorChu-Hsuan Sha
contributor authorChin C. Lee
date accessioned2017-05-09T00:43:12Z
date available2017-05-09T00:43:12Z
date copyrightJune, 2011
date issued2011
identifier issn1528-9044
identifier otherJEPAE4-26313#021003_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/145808
description abstractPure gold (Au) is used as a bonding medium to bond silicon (Si) chips to alumina substrates. The bonding process is performed at 260 °C with only 150 psi (1.0 MPa) static pressure applied. This is a solid-state bonding without any molten phase involved. The Au layer plated on alumina is ductile enough to deform for its surface to mate with the thin Au layer coated on Si. Au atoms on both sides of the bond line are brought within atomic distance and bonding is achieved. The ductile Au joint also accommodates the significant mismatch in coefficient of thermal expansion (CTE) between Si and alumina. Scanning electron microscope (SEM) evaluations show that nearly perfect joints are achieved and no voids are observed. Five samples are shear tested. They all pass the MIL-STD-883G standard. This bonding technique can be applied to bonding any two objects that can be coated with smooth Au layers. The 260 °C bonding temperature is compatible with typical reflow temperature of Sn3.5Ag solders used in electronic industries.
publisherThe American Society of Mechanical Engineers (ASME)
titleLow Temperature Solid State Gold Bonding of Si Chips to Alumina Substrates
typeJournal Paper
journal volume133
journal issue2
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.4003868
journal fristpage21003
identifier eissn1043-7398
keywordsBonding
keywordsSilicon chips
keywordsPressure
keywordsShear (Mechanics)
keywordsLow temperature AND Temperature
treeJournal of Electronic Packaging:;2011:;volume( 133 ):;issue: 002
contenttypeFulltext


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