YaBeSH Engineering and Technology Library

    • Journals
    • PaperQuest
    • YSE Standards
    • YaBeSH
    • Login
    View Item 
    •   YE&T Library
    • ASME
    • Journal of Electronic Packaging
    • View Item
    •   YE&T Library
    • ASME
    • Journal of Electronic Packaging
    • View Item
    • All Fields
    • Source Title
    • Year
    • Publisher
    • Title
    • Subject
    • Author
    • DOI
    • ISBN
    Advanced Search
    JavaScript is disabled for your browser. Some features of this site may not work without it.

    Archive

    Evaluation of Transverse Shear Effect on Film Delamination in Blister Test

    Source: Journal of Electronic Packaging:;2010:;volume( 132 ):;issue: 001::page 14501
    Author:
    Wei Wang
    ,
    Hongseok Noh
    ,
    Peter J. Hesketh
    ,
    Yong Huang
    ,
    Nicole Coutris
    DOI: 10.1115/1.4000717
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: The transverse shear effect has been frequently ignored in determining the debonding-related energy release rate and the phase angle in the blister test, resulting in underestimated values. This study aims to study the effect of shear force on the energy release rate and phase angle prediction in the blister test. A generalized approach is proposed to predict them under the effect of shear force. The predictions show that when the ratio of the film thickness to the debonded film window radius is large (such as 0.05), the transverse shear effect cannot be ignored in determining the energy release rate and the phase angle. The study also further illustrates the importance of including the shear force contribution in estimation and how this importance depends on the film thickness to debonded radius ratio, as well as the elastic mismatch.
    keyword(s): Force , Shear (Mechanics) , Film thickness , Stress AND Delamination ,
    • Download: (375.3Kb)
    • Show Full MetaData Hide Full MetaData
    • Get RIS
    • Item Order
    • Go To Publisher
    • Price: 5000 Rial
    • Statistics

      Evaluation of Transverse Shear Effect on Film Delamination in Blister Test

    URI
    http://yetl.yabesh.ir/yetl1/handle/yetl/142975
    Collections
    • Journal of Electronic Packaging

    Show full item record

    contributor authorWei Wang
    contributor authorHongseok Noh
    contributor authorPeter J. Hesketh
    contributor authorYong Huang
    contributor authorNicole Coutris
    date accessioned2017-05-09T00:37:16Z
    date available2017-05-09T00:37:16Z
    date copyrightMarch, 2010
    date issued2010
    identifier issn1528-9044
    identifier otherJEPAE4-26302#014501_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/142975
    description abstractThe transverse shear effect has been frequently ignored in determining the debonding-related energy release rate and the phase angle in the blister test, resulting in underestimated values. This study aims to study the effect of shear force on the energy release rate and phase angle prediction in the blister test. A generalized approach is proposed to predict them under the effect of shear force. The predictions show that when the ratio of the film thickness to the debonded film window radius is large (such as 0.05), the transverse shear effect cannot be ignored in determining the energy release rate and the phase angle. The study also further illustrates the importance of including the shear force contribution in estimation and how this importance depends on the film thickness to debonded radius ratio, as well as the elastic mismatch.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleEvaluation of Transverse Shear Effect on Film Delamination in Blister Test
    typeJournal Paper
    journal volume132
    journal issue1
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.4000717
    journal fristpage14501
    identifier eissn1043-7398
    keywordsForce
    keywordsShear (Mechanics)
    keywordsFilm thickness
    keywordsStress AND Delamination
    treeJournal of Electronic Packaging:;2010:;volume( 132 ):;issue: 001
    contenttypeFulltext
    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
    yabeshDSpacePersian
     
    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
    yabeshDSpacePersian