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    Comparative Study of Phenolic-Based and Amine-Based Underfill Materials in Flip Chip Plastic Ball Grid Array Package

    Source: Journal of Electronic Packaging:;2010:;volume( 132 ):;issue: 004::page 41012
    Author:
    Z. Kornain
    ,
    A. Jalar
    ,
    R. Rasid
    ,
    S. Abdullah
    DOI: 10.1115/1.4002741
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Phenolic and amine epoxy systems are widely used as hardeners in underfill materials for flip chip packaging. A comparison was made between these two systems in order to evaluate the reliability performance of a flip chip plastic ball grid array (FC-PBGA). The coefficient of thermal expansion, glass transition temperature (Tg), Young’s modulus (E), and fracture toughness were revealed by using a thermal mechanical analyzer, a dynamic mechanical analyzer, and a single-edge notch three-point bending test, while moisture absorption study was performed using an 85°C/85% relative humidity chamber. The adhesion strength with different conditions of temperature and humidity was performed using a die shear test. The series of standard reliability tests such as accelerated temperature cycle test, pressure cooker test, thermal humidity storage test, and high temperature storage test were executed upon the FC-PBGA, which was filled by phenolic and amine epoxy systems of underfill materials. It was found that the adhesion strength of phenolic-based underfills is better than that of amine-based underfills in almost all test conditions. Phenolic-based underfills also demonstrated better reliability compared with amine-based underfills.
    keyword(s): Temperature , Absorption , Reliability , Shear (Mechanics) , Fracture toughness , Ball-Grid-Array packaging , Flip-chip , Failure , Packaging , Epoxy adhesives , Elasticity , Mechanical properties , Stress , Cycles , Storage , High temperature , Glass transition , Bending strength AND Pressure ,
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      Comparative Study of Phenolic-Based and Amine-Based Underfill Materials in Flip Chip Plastic Ball Grid Array Package

    URI
    http://yetl.yabesh.ir/yetl1/handle/yetl/142935
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    • Journal of Electronic Packaging

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    contributor authorZ. Kornain
    contributor authorA. Jalar
    contributor authorR. Rasid
    contributor authorS. Abdullah
    date accessioned2017-05-09T00:37:12Z
    date available2017-05-09T00:37:12Z
    date copyrightDecember, 2010
    date issued2010
    identifier issn1528-9044
    identifier otherJEPAE4-26309#041012_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/142935
    description abstractPhenolic and amine epoxy systems are widely used as hardeners in underfill materials for flip chip packaging. A comparison was made between these two systems in order to evaluate the reliability performance of a flip chip plastic ball grid array (FC-PBGA). The coefficient of thermal expansion, glass transition temperature (Tg), Young’s modulus (E), and fracture toughness were revealed by using a thermal mechanical analyzer, a dynamic mechanical analyzer, and a single-edge notch three-point bending test, while moisture absorption study was performed using an 85°C/85% relative humidity chamber. The adhesion strength with different conditions of temperature and humidity was performed using a die shear test. The series of standard reliability tests such as accelerated temperature cycle test, pressure cooker test, thermal humidity storage test, and high temperature storage test were executed upon the FC-PBGA, which was filled by phenolic and amine epoxy systems of underfill materials. It was found that the adhesion strength of phenolic-based underfills is better than that of amine-based underfills in almost all test conditions. Phenolic-based underfills also demonstrated better reliability compared with amine-based underfills.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleComparative Study of Phenolic-Based and Amine-Based Underfill Materials in Flip Chip Plastic Ball Grid Array Package
    typeJournal Paper
    journal volume132
    journal issue4
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.4002741
    journal fristpage41012
    identifier eissn1043-7398
    keywordsTemperature
    keywordsAbsorption
    keywordsReliability
    keywordsShear (Mechanics)
    keywordsFracture toughness
    keywordsBall-Grid-Array packaging
    keywordsFlip-chip
    keywordsFailure
    keywordsPackaging
    keywordsEpoxy adhesives
    keywordsElasticity
    keywordsMechanical properties
    keywordsStress
    keywordsCycles
    keywordsStorage
    keywordsHigh temperature
    keywordsGlass transition
    keywordsBending strength AND Pressure
    treeJournal of Electronic Packaging:;2010:;volume( 132 ):;issue: 004
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
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