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contributor authorZ. Kornain
contributor authorA. Jalar
contributor authorR. Rasid
contributor authorS. Abdullah
date accessioned2017-05-09T00:37:12Z
date available2017-05-09T00:37:12Z
date copyrightDecember, 2010
date issued2010
identifier issn1528-9044
identifier otherJEPAE4-26309#041012_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/142935
description abstractPhenolic and amine epoxy systems are widely used as hardeners in underfill materials for flip chip packaging. A comparison was made between these two systems in order to evaluate the reliability performance of a flip chip plastic ball grid array (FC-PBGA). The coefficient of thermal expansion, glass transition temperature (Tg), Young’s modulus (E), and fracture toughness were revealed by using a thermal mechanical analyzer, a dynamic mechanical analyzer, and a single-edge notch three-point bending test, while moisture absorption study was performed using an 85°C/85% relative humidity chamber. The adhesion strength with different conditions of temperature and humidity was performed using a die shear test. The series of standard reliability tests such as accelerated temperature cycle test, pressure cooker test, thermal humidity storage test, and high temperature storage test were executed upon the FC-PBGA, which was filled by phenolic and amine epoxy systems of underfill materials. It was found that the adhesion strength of phenolic-based underfills is better than that of amine-based underfills in almost all test conditions. Phenolic-based underfills also demonstrated better reliability compared with amine-based underfills.
publisherThe American Society of Mechanical Engineers (ASME)
titleComparative Study of Phenolic-Based and Amine-Based Underfill Materials in Flip Chip Plastic Ball Grid Array Package
typeJournal Paper
journal volume132
journal issue4
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.4002741
journal fristpage41012
identifier eissn1043-7398
keywordsTemperature
keywordsAbsorption
keywordsReliability
keywordsShear (Mechanics)
keywordsFracture toughness
keywordsBall-Grid-Array packaging
keywordsFlip-chip
keywordsFailure
keywordsPackaging
keywordsEpoxy adhesives
keywordsElasticity
keywordsMechanical properties
keywordsStress
keywordsCycles
keywordsStorage
keywordsHigh temperature
keywordsGlass transition
keywordsBending strength AND Pressure
treeJournal of Electronic Packaging:;2010:;volume( 132 ):;issue: 004
contenttypeFulltext


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