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    Special Issue on Dynamic Modeling, Control and Manipulation at the Nanoscale

    Source: Journal of Dynamic Systems, Measurement, and Control:;2009:;volume( 131 ):;issue: 006::page 60301
    Author:
    Nader Jalili
    ,
    Laxman Saggere
    ,
    Arvind Raman
    DOI: 10.1115/1.4000554
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Most of today's emerging nanotechnological applications such as nanoelectromechanical systems require comprehensive modeling, control and manipulation of objects, components and subsystems ranging in sizes from few nanometers to micrometers. An important task amongst many challenging aspects of “nanoscale” manipulation and control design is to overcome the added complexity of uncertainties and nonlinearities that are unique to nanoscale. This added complexity combined with the sub-nanometer precision requirement calls for development of fundamentally new techniques and controllers for these applications. In an effort to respond to such demanding needs for new directions in modeling and control at the nanoscale, this special issue attempts to bring together the current advances in this area and target current research and development efforts in nanoscale control and manipulation techniques including scanning probe microscopy (SPM) systems as well as nanorobotic manipulation.
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      Special Issue on Dynamic Modeling, Control and Manipulation at the Nanoscale

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    http://yetl.yabesh.ir/yetl1/handle/yetl/140163
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    contributor authorNader Jalili
    contributor authorLaxman Saggere
    contributor authorArvind Raman
    date accessioned2017-05-09T00:32:06Z
    date available2017-05-09T00:32:06Z
    date copyrightNovember, 2009
    date issued2009
    identifier issn0022-0434
    identifier otherJDSMAA-26505#060301_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/140163
    description abstractMost of today's emerging nanotechnological applications such as nanoelectromechanical systems require comprehensive modeling, control and manipulation of objects, components and subsystems ranging in sizes from few nanometers to micrometers. An important task amongst many challenging aspects of “nanoscale” manipulation and control design is to overcome the added complexity of uncertainties and nonlinearities that are unique to nanoscale. This added complexity combined with the sub-nanometer precision requirement calls for development of fundamentally new techniques and controllers for these applications. In an effort to respond to such demanding needs for new directions in modeling and control at the nanoscale, this special issue attempts to bring together the current advances in this area and target current research and development efforts in nanoscale control and manipulation techniques including scanning probe microscopy (SPM) systems as well as nanorobotic manipulation.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleSpecial Issue on Dynamic Modeling, Control and Manipulation at the Nanoscale
    typeJournal Paper
    journal volume131
    journal issue6
    journal titleJournal of Dynamic Systems, Measurement, and Control
    identifier doi10.1115/1.4000554
    journal fristpage60301
    identifier eissn1528-9028
    treeJournal of Dynamic Systems, Measurement, and Control:;2009:;volume( 131 ):;issue: 006
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
    yabeshDSpacePersian