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contributor authorNader Jalili
contributor authorLaxman Saggere
contributor authorArvind Raman
date accessioned2017-05-09T00:32:06Z
date available2017-05-09T00:32:06Z
date copyrightNovember, 2009
date issued2009
identifier issn0022-0434
identifier otherJDSMAA-26505#060301_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/140163
description abstractMost of today's emerging nanotechnological applications such as nanoelectromechanical systems require comprehensive modeling, control and manipulation of objects, components and subsystems ranging in sizes from few nanometers to micrometers. An important task amongst many challenging aspects of “nanoscale” manipulation and control design is to overcome the added complexity of uncertainties and nonlinearities that are unique to nanoscale. This added complexity combined with the sub-nanometer precision requirement calls for development of fundamentally new techniques and controllers for these applications. In an effort to respond to such demanding needs for new directions in modeling and control at the nanoscale, this special issue attempts to bring together the current advances in this area and target current research and development efforts in nanoscale control and manipulation techniques including scanning probe microscopy (SPM) systems as well as nanorobotic manipulation.
publisherThe American Society of Mechanical Engineers (ASME)
titleSpecial Issue on Dynamic Modeling, Control and Manipulation at the Nanoscale
typeJournal Paper
journal volume131
journal issue6
journal titleJournal of Dynamic Systems, Measurement, and Control
identifier doi10.1115/1.4000554
journal fristpage60301
identifier eissn1528-9028
treeJournal of Dynamic Systems, Measurement, and Control:;2009:;volume( 131 ):;issue: 006
contenttypeFulltext


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