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    Determination of Strain Gradient Plasticity Length Scale for Microelectronics Solder Alloys

    Source: Journal of Electronic Packaging:;2007:;volume( 129 ):;issue: 002::page 120
    Author:
    Juan Gomez
    ,
    Cemal Basaran
    DOI: 10.1115/1.2721082
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Strain gradient plasticity theories that have emerged during recent years to provide an explanation for size dependent behavior exhibited by some materials have also created a need for additional material parameters. In this study on Pb∕Sn solder alloys’ material length scale, which is needed for use in strain gradient plasticity type constitutive models, is determined. The value of length scale is in agreement with values available in literature for different materials like copper, nickel, and aluminum.
    keyword(s): Alloys , Solders , Gradients , Nanoindentation , Microelectronic devices , Plasticity AND Copper ,
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      Determination of Strain Gradient Plasticity Length Scale for Microelectronics Solder Alloys

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    contributor authorJuan Gomez
    contributor authorCemal Basaran
    date accessioned2017-05-09T00:23:23Z
    date available2017-05-09T00:23:23Z
    date copyrightJune, 2007
    date issued2007
    identifier issn1528-9044
    identifier otherJEPAE4-26275#120_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/135563
    description abstractStrain gradient plasticity theories that have emerged during recent years to provide an explanation for size dependent behavior exhibited by some materials have also created a need for additional material parameters. In this study on Pb∕Sn solder alloys’ material length scale, which is needed for use in strain gradient plasticity type constitutive models, is determined. The value of length scale is in agreement with values available in literature for different materials like copper, nickel, and aluminum.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleDetermination of Strain Gradient Plasticity Length Scale for Microelectronics Solder Alloys
    typeJournal Paper
    journal volume129
    journal issue2
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.2721082
    journal fristpage120
    journal lastpage128
    identifier eissn1043-7398
    keywordsAlloys
    keywordsSolders
    keywordsGradients
    keywordsNanoindentation
    keywordsMicroelectronic devices
    keywordsPlasticity AND Copper
    treeJournal of Electronic Packaging:;2007:;volume( 129 ):;issue: 002
    contenttypeFulltext
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