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    A Note on Suhir’s Solution of Thermal Stresses for a Die-Substrate Assembly

    Source: Journal of Electronic Packaging:;2004:;volume( 126 ):;issue: 001::page 115
    Author:
    M. Y. Tsai
    ,
    C. H. Hsu
    ,
    C. N. Han
    DOI: 10.1115/1.1648056
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: The well-known, closed-form solution to thermal stresses of a die-substrate assembly is initially provided by Suhir in the mid-1980’s after Timoshenko [1] and Chen and Nelson [2]. It has been revised several times in its die attach (adhesive) peel solution by Suhir [3][4], and Mishkevich and Suhir [5]. However, there still exist some controversies and inconsistencies regarding die stresses, die attach shear and peel stresses, and warpage (deformation) of the assembly. In the study, Suhir’s derivation of the solution is closely examined in details, and the corrections to the solution are suggested and verified by comparing with the finite element results. It is shown that, unlike the original Suhir solution, the corrected one gives very good prediction of thermal stresses and deformations of die-substrate assembly. The limitation of the Suhir solution is also discussed in this study.
    keyword(s): Manufacturing , Stress , Shear (Mechanics) , Thermal stresses , Warping , Finite element analysis , Deformation AND Adhesives ,
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      A Note on Suhir’s Solution of Thermal Stresses for a Die-Substrate Assembly

    URI
    http://yetl.yabesh.ir/yetl1/handle/yetl/129899
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    contributor authorM. Y. Tsai
    contributor authorC. H. Hsu
    contributor authorC. N. Han
    date accessioned2017-05-09T00:12:46Z
    date available2017-05-09T00:12:46Z
    date copyrightMarch, 2004
    date issued2004
    identifier issn1528-9044
    identifier otherJEPAE4-26228#115_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/129899
    description abstractThe well-known, closed-form solution to thermal stresses of a die-substrate assembly is initially provided by Suhir in the mid-1980’s after Timoshenko [1] and Chen and Nelson [2]. It has been revised several times in its die attach (adhesive) peel solution by Suhir [3][4], and Mishkevich and Suhir [5]. However, there still exist some controversies and inconsistencies regarding die stresses, die attach shear and peel stresses, and warpage (deformation) of the assembly. In the study, Suhir’s derivation of the solution is closely examined in details, and the corrections to the solution are suggested and verified by comparing with the finite element results. It is shown that, unlike the original Suhir solution, the corrected one gives very good prediction of thermal stresses and deformations of die-substrate assembly. The limitation of the Suhir solution is also discussed in this study.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleA Note on Suhir’s Solution of Thermal Stresses for a Die-Substrate Assembly
    typeJournal Paper
    journal volume126
    journal issue1
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.1648056
    journal fristpage115
    journal lastpage119
    identifier eissn1043-7398
    keywordsManufacturing
    keywordsStress
    keywordsShear (Mechanics)
    keywordsThermal stresses
    keywordsWarping
    keywordsFinite element analysis
    keywordsDeformation AND Adhesives
    treeJournal of Electronic Packaging:;2004:;volume( 126 ):;issue: 001
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
    yabeshDSpacePersian