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contributor authorM. Y. Tsai
contributor authorC. H. Hsu
contributor authorC. N. Han
date accessioned2017-05-09T00:12:46Z
date available2017-05-09T00:12:46Z
date copyrightMarch, 2004
date issued2004
identifier issn1528-9044
identifier otherJEPAE4-26228#115_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/129899
description abstractThe well-known, closed-form solution to thermal stresses of a die-substrate assembly is initially provided by Suhir in the mid-1980’s after Timoshenko [1] and Chen and Nelson [2]. It has been revised several times in its die attach (adhesive) peel solution by Suhir [3][4], and Mishkevich and Suhir [5]. However, there still exist some controversies and inconsistencies regarding die stresses, die attach shear and peel stresses, and warpage (deformation) of the assembly. In the study, Suhir’s derivation of the solution is closely examined in details, and the corrections to the solution are suggested and verified by comparing with the finite element results. It is shown that, unlike the original Suhir solution, the corrected one gives very good prediction of thermal stresses and deformations of die-substrate assembly. The limitation of the Suhir solution is also discussed in this study.
publisherThe American Society of Mechanical Engineers (ASME)
titleA Note on Suhir’s Solution of Thermal Stresses for a Die-Substrate Assembly
typeJournal Paper
journal volume126
journal issue1
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.1648056
journal fristpage115
journal lastpage119
identifier eissn1043-7398
keywordsManufacturing
keywordsStress
keywordsShear (Mechanics)
keywordsThermal stresses
keywordsWarping
keywordsFinite element analysis
keywordsDeformation AND Adhesives
treeJournal of Electronic Packaging:;2004:;volume( 126 ):;issue: 001
contenttypeFulltext


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