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    Failure Analysis of Miniature Solder Specimen

    Source: Journal of Electronic Packaging:;2004:;volume( 126 ):;issue: 001::page 100
    Author:
    Y. Wei
    ,
    H. E. Fang
    ,
    T. J. Lim
    ,
    W. Lu
    ,
    M. K. Neilsen
    ,
    C. L. Chow
    DOI: 10.1115/1.1648060
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: The effects of specimen geometry size on the behavior of 63Sn-37Pb solder are investigated both experimentally in the laboratory and analytically with finite-element simulations. The simulations are achieved by developing a constitutive model for solder which couples viscoplasticity with a unified damage theory. The unified damage theory is characterized by a damage surface in strain space which separates fatigue damage from inelastic damage. The damage evolution equations are derived within the framework of irreversible thermodynamics. A series of uniaxial tension, tensile creep, and strain-controlled fatigue experiments are performed to obtain material parameters for the solder damage model. The solder damage model is then implemented into a finite element code and used to simulate a uniaxial tension test on a miniature specimen and on a standard ASTM specimen (ASTM Standards, 1999, “Tension Testing of Metallic Materials,” ASTM E8-78). Predictions from these simulations are then compared with each other and with experimental results in order to examine microstructure size effects.
    keyword(s): Solders , Equations , Failure analysis , Constitutive equations , Tension , Finite element analysis , Stress , Fatigue damage , Computer simulation , Creep , Fatigue , Geometry , ASTM International AND Irreversible thermodynamics ,
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      Failure Analysis of Miniature Solder Specimen

    URI
    http://yetl.yabesh.ir/yetl1/handle/yetl/129896
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    • Journal of Electronic Packaging

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    contributor authorY. Wei
    contributor authorH. E. Fang
    contributor authorT. J. Lim
    contributor authorW. Lu
    contributor authorM. K. Neilsen
    contributor authorC. L. Chow
    date accessioned2017-05-09T00:12:46Z
    date available2017-05-09T00:12:46Z
    date copyrightMarch, 2004
    date issued2004
    identifier issn1528-9044
    identifier otherJEPAE4-26228#100_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/129896
    description abstractThe effects of specimen geometry size on the behavior of 63Sn-37Pb solder are investigated both experimentally in the laboratory and analytically with finite-element simulations. The simulations are achieved by developing a constitutive model for solder which couples viscoplasticity with a unified damage theory. The unified damage theory is characterized by a damage surface in strain space which separates fatigue damage from inelastic damage. The damage evolution equations are derived within the framework of irreversible thermodynamics. A series of uniaxial tension, tensile creep, and strain-controlled fatigue experiments are performed to obtain material parameters for the solder damage model. The solder damage model is then implemented into a finite element code and used to simulate a uniaxial tension test on a miniature specimen and on a standard ASTM specimen (ASTM Standards, 1999, “Tension Testing of Metallic Materials,” ASTM E8-78). Predictions from these simulations are then compared with each other and with experimental results in order to examine microstructure size effects.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleFailure Analysis of Miniature Solder Specimen
    typeJournal Paper
    journal volume126
    journal issue1
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.1648060
    journal fristpage100
    journal lastpage105
    identifier eissn1043-7398
    keywordsSolders
    keywordsEquations
    keywordsFailure analysis
    keywordsConstitutive equations
    keywordsTension
    keywordsFinite element analysis
    keywordsStress
    keywordsFatigue damage
    keywordsComputer simulation
    keywordsCreep
    keywordsFatigue
    keywordsGeometry
    keywordsASTM International AND Irreversible thermodynamics
    treeJournal of Electronic Packaging:;2004:;volume( 126 ):;issue: 001
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
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