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contributor authorY. Wei
contributor authorH. E. Fang
contributor authorT. J. Lim
contributor authorW. Lu
contributor authorM. K. Neilsen
contributor authorC. L. Chow
date accessioned2017-05-09T00:12:46Z
date available2017-05-09T00:12:46Z
date copyrightMarch, 2004
date issued2004
identifier issn1528-9044
identifier otherJEPAE4-26228#100_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/129896
description abstractThe effects of specimen geometry size on the behavior of 63Sn-37Pb solder are investigated both experimentally in the laboratory and analytically with finite-element simulations. The simulations are achieved by developing a constitutive model for solder which couples viscoplasticity with a unified damage theory. The unified damage theory is characterized by a damage surface in strain space which separates fatigue damage from inelastic damage. The damage evolution equations are derived within the framework of irreversible thermodynamics. A series of uniaxial tension, tensile creep, and strain-controlled fatigue experiments are performed to obtain material parameters for the solder damage model. The solder damage model is then implemented into a finite element code and used to simulate a uniaxial tension test on a miniature specimen and on a standard ASTM specimen (ASTM Standards, 1999, “Tension Testing of Metallic Materials,” ASTM E8-78). Predictions from these simulations are then compared with each other and with experimental results in order to examine microstructure size effects.
publisherThe American Society of Mechanical Engineers (ASME)
titleFailure Analysis of Miniature Solder Specimen
typeJournal Paper
journal volume126
journal issue1
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.1648060
journal fristpage100
journal lastpage105
identifier eissn1043-7398
keywordsSolders
keywordsEquations
keywordsFailure analysis
keywordsConstitutive equations
keywordsTension
keywordsFinite element analysis
keywordsStress
keywordsFatigue damage
keywordsComputer simulation
keywordsCreep
keywordsFatigue
keywordsGeometry
keywordsASTM International AND Irreversible thermodynamics
treeJournal of Electronic Packaging:;2004:;volume( 126 ):;issue: 001
contenttypeFulltext


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