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    Testing and Modeling of Solders Using New Test Device, Part 1: Models and Testing

    Source: Journal of Electronic Packaging:;2004:;volume( 126 ):;issue: 002::page 225
    Author:
    Chandrakant S. Desai
    ,
    Russell Whitenack
    ,
    Tribikram Kundu
    ,
    Zhichao Wang
    DOI: 10.1115/1.1756146
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: For realistic design, reliability and failure analysis of materials such as solders for problems in electronic packaging, it is essential to develop and validate appropriate constitutive models. Such models should include effect of important factors such as elastic, plastic and creep behavior, microcracking leading to fracture and failure, and cyclic mechanical and thermal loading including rate, dwell time, and amplitude.
    keyword(s): Solders , Testing , Stress , Modeling , Constitutive equations AND Fracture (Process) ,
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      Testing and Modeling of Solders Using New Test Device, Part 1: Models and Testing

    URI
    http://yetl.yabesh.ir/yetl1/handle/yetl/129870
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    contributor authorChandrakant S. Desai
    contributor authorRussell Whitenack
    contributor authorTribikram Kundu
    contributor authorZhichao Wang
    date accessioned2017-05-09T00:12:44Z
    date available2017-05-09T00:12:44Z
    date copyrightJune, 2004
    date issued2004
    identifier issn1528-9044
    identifier otherJEPAE4-26233#225_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/129870
    description abstractFor realistic design, reliability and failure analysis of materials such as solders for problems in electronic packaging, it is essential to develop and validate appropriate constitutive models. Such models should include effect of important factors such as elastic, plastic and creep behavior, microcracking leading to fracture and failure, and cyclic mechanical and thermal loading including rate, dwell time, and amplitude.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleTesting and Modeling of Solders Using New Test Device, Part 1: Models and Testing
    typeJournal Paper
    journal volume126
    journal issue2
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.1756146
    journal fristpage225
    journal lastpage231
    identifier eissn1043-7398
    keywordsSolders
    keywordsTesting
    keywordsStress
    keywordsModeling
    keywordsConstitutive equations AND Fracture (Process)
    treeJournal of Electronic Packaging:;2004:;volume( 126 ):;issue: 002
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
    yabeshDSpacePersian