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contributor authorChandrakant S. Desai
contributor authorRussell Whitenack
contributor authorTribikram Kundu
contributor authorZhichao Wang
date accessioned2017-05-09T00:12:44Z
date available2017-05-09T00:12:44Z
date copyrightJune, 2004
date issued2004
identifier issn1528-9044
identifier otherJEPAE4-26233#225_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/129870
description abstractFor realistic design, reliability and failure analysis of materials such as solders for problems in electronic packaging, it is essential to develop and validate appropriate constitutive models. Such models should include effect of important factors such as elastic, plastic and creep behavior, microcracking leading to fracture and failure, and cyclic mechanical and thermal loading including rate, dwell time, and amplitude.
publisherThe American Society of Mechanical Engineers (ASME)
titleTesting and Modeling of Solders Using New Test Device, Part 1: Models and Testing
typeJournal Paper
journal volume126
journal issue2
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.1756146
journal fristpage225
journal lastpage231
identifier eissn1043-7398
keywordsSolders
keywordsTesting
keywordsStress
keywordsModeling
keywordsConstitutive equations AND Fracture (Process)
treeJournal of Electronic Packaging:;2004:;volume( 126 ):;issue: 002
contenttypeFulltext


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