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    Behavior of Lead-Free Solder Under Thermomechanical Loading

    Source: Journal of Electronic Packaging:;2004:;volume( 126 ):;issue: 003::page 367
    Author:
    Y. Wei
    ,
    K. J. Lau
    ,
    P. Vianco
    ,
    H. E. Fang
    ,
    C. L. Chow
    DOI: 10.1115/1.1773197
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: This paper presents an investigation of lead-free Sn-Ag base alloy, 95.5Sn-3.9Ag-0.6Cu, both experimentally and analytically. Experimentally, the deformation behavior of the material was measured for different temperatures (25°C and 1000°C) over a range of strain rates (10−5 to 10−3/s) under isothermal and thermomechanical conditions. Development of a unified viscoplastic constitutive model followed, taking into account the effects of the measured strain rate and temperature changes. The temperature rate effects are considered in the evolution equation of back stress. In order to include material degradation in the solder, the theory of damage mechanics is applied by introducing two damage variables in the viscoplastic constitutive model. Finally, the constitutive model is coded into a general-purpose finite element computer program (ABAQUS) through its user-defined material subroutine (UMAT). The damage-coupled finite element analysis (FEA) is then employed to monitor the condition of failure of a notched component. The predicted and measured maximum loads have been compared and found to be satisfactory. In addition, the calculated damage distribution contours enable the identification of potential failure site for failure analysis.
    keyword(s): Temperature , Alloys , Solders , Stress , Constitutive equations , Finite element analysis , Equations , Failure , Lead-free solders , Deformation , Materials degradation , Computer software AND Failure analysis ,
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      Behavior of Lead-Free Solder Under Thermomechanical Loading

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    http://yetl.yabesh.ir/yetl1/handle/yetl/129858
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    contributor authorY. Wei
    contributor authorK. J. Lau
    contributor authorP. Vianco
    contributor authorH. E. Fang
    contributor authorC. L. Chow
    date accessioned2017-05-09T00:12:42Z
    date available2017-05-09T00:12:42Z
    date copyrightSeptember, 2004
    date issued2004
    identifier issn1528-9044
    identifier otherJEPAE4-26235#367_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/129858
    description abstractThis paper presents an investigation of lead-free Sn-Ag base alloy, 95.5Sn-3.9Ag-0.6Cu, both experimentally and analytically. Experimentally, the deformation behavior of the material was measured for different temperatures (25°C and 1000°C) over a range of strain rates (10−5 to 10−3/s) under isothermal and thermomechanical conditions. Development of a unified viscoplastic constitutive model followed, taking into account the effects of the measured strain rate and temperature changes. The temperature rate effects are considered in the evolution equation of back stress. In order to include material degradation in the solder, the theory of damage mechanics is applied by introducing two damage variables in the viscoplastic constitutive model. Finally, the constitutive model is coded into a general-purpose finite element computer program (ABAQUS) through its user-defined material subroutine (UMAT). The damage-coupled finite element analysis (FEA) is then employed to monitor the condition of failure of a notched component. The predicted and measured maximum loads have been compared and found to be satisfactory. In addition, the calculated damage distribution contours enable the identification of potential failure site for failure analysis.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleBehavior of Lead-Free Solder Under Thermomechanical Loading
    typeJournal Paper
    journal volume126
    journal issue3
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.1773197
    journal fristpage367
    journal lastpage373
    identifier eissn1043-7398
    keywordsTemperature
    keywordsAlloys
    keywordsSolders
    keywordsStress
    keywordsConstitutive equations
    keywordsFinite element analysis
    keywordsEquations
    keywordsFailure
    keywordsLead-free solders
    keywordsDeformation
    keywordsMaterials degradation
    keywordsComputer software AND Failure analysis
    treeJournal of Electronic Packaging:;2004:;volume( 126 ):;issue: 003
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
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