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contributor authorY. Wei
contributor authorK. J. Lau
contributor authorP. Vianco
contributor authorH. E. Fang
contributor authorC. L. Chow
date accessioned2017-05-09T00:12:42Z
date available2017-05-09T00:12:42Z
date copyrightSeptember, 2004
date issued2004
identifier issn1528-9044
identifier otherJEPAE4-26235#367_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/129858
description abstractThis paper presents an investigation of lead-free Sn-Ag base alloy, 95.5Sn-3.9Ag-0.6Cu, both experimentally and analytically. Experimentally, the deformation behavior of the material was measured for different temperatures (25°C and 1000°C) over a range of strain rates (10−5 to 10−3/s) under isothermal and thermomechanical conditions. Development of a unified viscoplastic constitutive model followed, taking into account the effects of the measured strain rate and temperature changes. The temperature rate effects are considered in the evolution equation of back stress. In order to include material degradation in the solder, the theory of damage mechanics is applied by introducing two damage variables in the viscoplastic constitutive model. Finally, the constitutive model is coded into a general-purpose finite element computer program (ABAQUS) through its user-defined material subroutine (UMAT). The damage-coupled finite element analysis (FEA) is then employed to monitor the condition of failure of a notched component. The predicted and measured maximum loads have been compared and found to be satisfactory. In addition, the calculated damage distribution contours enable the identification of potential failure site for failure analysis.
publisherThe American Society of Mechanical Engineers (ASME)
titleBehavior of Lead-Free Solder Under Thermomechanical Loading
typeJournal Paper
journal volume126
journal issue3
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.1773197
journal fristpage367
journal lastpage373
identifier eissn1043-7398
keywordsTemperature
keywordsAlloys
keywordsSolders
keywordsStress
keywordsConstitutive equations
keywordsFinite element analysis
keywordsEquations
keywordsFailure
keywordsLead-free solders
keywordsDeformation
keywordsMaterials degradation
keywordsComputer software AND Failure analysis
treeJournal of Electronic Packaging:;2004:;volume( 126 ):;issue: 003
contenttypeFulltext


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