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    Analytical Thermo-Mechanical Model for Non-Underfilled Area Array Flip Chip Assemblies

    Source: Journal of Electronic Packaging:;2004:;volume( 126 ):;issue: 003::page 351
    Author:
    Bart Vandevelde
    ,
    Dirk Vandepitte
    ,
    Martine Baelmans
    ,
    Eric Beyne
    DOI: 10.1115/1.1772416
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: An analytical model is derived for the calculation of thermo-mechanical induced stresses in area array flip chip assemblies. This analytical model is based on structural mechanics and has the ability to characterize the nature and to estimate the magnitude of the induced stresses. The extension of this model compared to existing procedures is its applicability to area array systems, which behave significantly different from peripheral assemblies. The model is compared to finite element simulations. The model calculates accurately the forces and bending moments acting on the flip chip connections. The transformation of these forces and moments into stresses is less accurate as the model does not include stress concentrations near the corners. The model simulates very well the different parameter trends such as chip size and is therefore well suited for understanding parameter sensitivity studies.
    keyword(s): Force , Stress , Flip-chip assemblies AND Flip-chip ,
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      Analytical Thermo-Mechanical Model for Non-Underfilled Area Array Flip Chip Assemblies

    URI
    http://yetl.yabesh.ir/yetl1/handle/yetl/129855
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    • Journal of Electronic Packaging

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    contributor authorBart Vandevelde
    contributor authorDirk Vandepitte
    contributor authorMartine Baelmans
    contributor authorEric Beyne
    date accessioned2017-05-09T00:12:42Z
    date available2017-05-09T00:12:42Z
    date copyrightSeptember, 2004
    date issued2004
    identifier issn1528-9044
    identifier otherJEPAE4-26235#351_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/129855
    description abstractAn analytical model is derived for the calculation of thermo-mechanical induced stresses in area array flip chip assemblies. This analytical model is based on structural mechanics and has the ability to characterize the nature and to estimate the magnitude of the induced stresses. The extension of this model compared to existing procedures is its applicability to area array systems, which behave significantly different from peripheral assemblies. The model is compared to finite element simulations. The model calculates accurately the forces and bending moments acting on the flip chip connections. The transformation of these forces and moments into stresses is less accurate as the model does not include stress concentrations near the corners. The model simulates very well the different parameter trends such as chip size and is therefore well suited for understanding parameter sensitivity studies.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleAnalytical Thermo-Mechanical Model for Non-Underfilled Area Array Flip Chip Assemblies
    typeJournal Paper
    journal volume126
    journal issue3
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.1772416
    journal fristpage351
    journal lastpage358
    identifier eissn1043-7398
    keywordsForce
    keywordsStress
    keywordsFlip-chip assemblies AND Flip-chip
    treeJournal of Electronic Packaging:;2004:;volume( 126 ):;issue: 003
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
    yabeshDSpacePersian