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contributor authorBart Vandevelde
contributor authorDirk Vandepitte
contributor authorMartine Baelmans
contributor authorEric Beyne
date accessioned2017-05-09T00:12:42Z
date available2017-05-09T00:12:42Z
date copyrightSeptember, 2004
date issued2004
identifier issn1528-9044
identifier otherJEPAE4-26235#351_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/129855
description abstractAn analytical model is derived for the calculation of thermo-mechanical induced stresses in area array flip chip assemblies. This analytical model is based on structural mechanics and has the ability to characterize the nature and to estimate the magnitude of the induced stresses. The extension of this model compared to existing procedures is its applicability to area array systems, which behave significantly different from peripheral assemblies. The model is compared to finite element simulations. The model calculates accurately the forces and bending moments acting on the flip chip connections. The transformation of these forces and moments into stresses is less accurate as the model does not include stress concentrations near the corners. The model simulates very well the different parameter trends such as chip size and is therefore well suited for understanding parameter sensitivity studies.
publisherThe American Society of Mechanical Engineers (ASME)
titleAnalytical Thermo-Mechanical Model for Non-Underfilled Area Array Flip Chip Assemblies
typeJournal Paper
journal volume126
journal issue3
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.1772416
journal fristpage351
journal lastpage358
identifier eissn1043-7398
keywordsForce
keywordsStress
keywordsFlip-chip assemblies AND Flip-chip
treeJournal of Electronic Packaging:;2004:;volume( 126 ):;issue: 003
contenttypeFulltext


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