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    Moisture Absorption Analysis of Interfacial Fracture Test Specimens Composed of No-Flow Underfill Materials

    Source: Journal of Electronic Packaging:;2003:;volume( 125 ):;issue: 001::page 24
    Author:
    Timothy Ferguson
    ,
    Jianmin Qu
    DOI: 10.1115/1.1524132
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: In a previous study, we found that moisture preconditioning strongly influenced the interfacial fracture toughness of the underfill/solder mask interface, decreasing the interfacial adhesion by approximately one-half for both classifications of underfill/solder mask interfaces after 725 h of exposure at 85°C/85%RH. To better understand the rate and mechanisms for moisture transport through the interfacial fracture test specimens, a diffusion analysis was implemented based on traditional, analytical solutions of Fick’s second law of diffusion. Test specimens were constructed to experimentally determine the diffusion coefficient for each underfill. Since both underfill encapsulants proved to exhibit non-Fickian behavior at 85°C/85%RH, the application of the analytical Fickian solution for the test specimens was limited to the associated JEDEC criteria of 168 hours for 85°C/85%RH. A finite element analysis was performed to illustrate the moisture concentration in the interfacial fracture test specimens for initial times of exposure to the humid environment. The results of this study demonstrate that the presence of amine functional groups considerably retard moisture penetration through underfill encapsulants.
    keyword(s): Diffusion (Physics) , Absorption , Fracture (Process) , Resins , Masks , Solders AND Flow (Dynamics) ,
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      Moisture Absorption Analysis of Interfacial Fracture Test Specimens Composed of No-Flow Underfill Materials

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    http://yetl.yabesh.ir/yetl1/handle/yetl/128237
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    contributor authorTimothy Ferguson
    contributor authorJianmin Qu
    date accessioned2017-05-09T00:09:55Z
    date available2017-05-09T00:09:55Z
    date copyrightMarch, 2003
    date issued2003
    identifier issn1528-9044
    identifier otherJEPAE4-26212#24_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/128237
    description abstractIn a previous study, we found that moisture preconditioning strongly influenced the interfacial fracture toughness of the underfill/solder mask interface, decreasing the interfacial adhesion by approximately one-half for both classifications of underfill/solder mask interfaces after 725 h of exposure at 85°C/85%RH. To better understand the rate and mechanisms for moisture transport through the interfacial fracture test specimens, a diffusion analysis was implemented based on traditional, analytical solutions of Fick’s second law of diffusion. Test specimens were constructed to experimentally determine the diffusion coefficient for each underfill. Since both underfill encapsulants proved to exhibit non-Fickian behavior at 85°C/85%RH, the application of the analytical Fickian solution for the test specimens was limited to the associated JEDEC criteria of 168 hours for 85°C/85%RH. A finite element analysis was performed to illustrate the moisture concentration in the interfacial fracture test specimens for initial times of exposure to the humid environment. The results of this study demonstrate that the presence of amine functional groups considerably retard moisture penetration through underfill encapsulants.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleMoisture Absorption Analysis of Interfacial Fracture Test Specimens Composed of No-Flow Underfill Materials
    typeJournal Paper
    journal volume125
    journal issue1
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.1524132
    journal fristpage24
    journal lastpage30
    identifier eissn1043-7398
    keywordsDiffusion (Physics)
    keywordsAbsorption
    keywordsFracture (Process)
    keywordsResins
    keywordsMasks
    keywordsSolders AND Flow (Dynamics)
    treeJournal of Electronic Packaging:;2003:;volume( 125 ):;issue: 001
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
    yabeshDSpacePersian