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contributor authorTimothy Ferguson
contributor authorJianmin Qu
date accessioned2017-05-09T00:09:55Z
date available2017-05-09T00:09:55Z
date copyrightMarch, 2003
date issued2003
identifier issn1528-9044
identifier otherJEPAE4-26212#24_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/128237
description abstractIn a previous study, we found that moisture preconditioning strongly influenced the interfacial fracture toughness of the underfill/solder mask interface, decreasing the interfacial adhesion by approximately one-half for both classifications of underfill/solder mask interfaces after 725 h of exposure at 85°C/85%RH. To better understand the rate and mechanisms for moisture transport through the interfacial fracture test specimens, a diffusion analysis was implemented based on traditional, analytical solutions of Fick’s second law of diffusion. Test specimens were constructed to experimentally determine the diffusion coefficient for each underfill. Since both underfill encapsulants proved to exhibit non-Fickian behavior at 85°C/85%RH, the application of the analytical Fickian solution for the test specimens was limited to the associated JEDEC criteria of 168 hours for 85°C/85%RH. A finite element analysis was performed to illustrate the moisture concentration in the interfacial fracture test specimens for initial times of exposure to the humid environment. The results of this study demonstrate that the presence of amine functional groups considerably retard moisture penetration through underfill encapsulants.
publisherThe American Society of Mechanical Engineers (ASME)
titleMoisture Absorption Analysis of Interfacial Fracture Test Specimens Composed of No-Flow Underfill Materials
typeJournal Paper
journal volume125
journal issue1
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.1524132
journal fristpage24
journal lastpage30
identifier eissn1043-7398
keywordsDiffusion (Physics)
keywordsAbsorption
keywordsFracture (Process)
keywordsResins
keywordsMasks
keywordsSolders AND Flow (Dynamics)
treeJournal of Electronic Packaging:;2003:;volume( 125 ):;issue: 001
contenttypeFulltext


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