| contributor author | Jaap M. J. den Toonder | |
| contributor author | Christian W. Rademaker | |
| contributor author | Ching-Li Hu | |
| date accessioned | 2017-05-09T00:09:50Z | |
| date available | 2017-05-09T00:09:50Z | |
| date copyright | December, 2003 | |
| date issued | 2003 | |
| identifier issn | 1528-9044 | |
| identifier other | JEPAE4-26225#506_1.pdf | |
| identifier uri | http://yetl.yabesh.ir/yetl/handle/yetl/128170 | |
| description abstract | In this paper, we present a combined experimental and computational study of the thermomechanical reliability of multilayer ceramic capacitors (MLCC’s). We focus on residual stresses introduced into the components during the cooling down step of the sintering process. The technique of microindentation turned out to be a useful method to measure the stresses locally. The computations were done with three-dimensional finite element simulations. We find that the cooling step introduces compressive in-plane stresses in the ceramic layers. There is reasonably good overall agreement between the residual stresses obtained from the indentation experiments and the numerical simulations. Some discrepancies do exist, though, for measurements on cross-sectioned MLCC’s. Possible reasons for the differences are discussed. | |
| publisher | The American Society of Mechanical Engineers (ASME) | |
| title | Residual Stresses in Multilayer Ceramic Capacitors: Measurement and Computation | |
| type | Journal Paper | |
| journal volume | 125 | |
| journal issue | 4 | |
| journal title | Journal of Electronic Packaging | |
| identifier doi | 10.1115/1.1604151 | |
| journal fristpage | 506 | |
| journal lastpage | 511 | |
| identifier eissn | 1043-7398 | |
| keywords | Ceramics | |
| keywords | Measurement | |
| keywords | Computer simulation | |
| keywords | Sintering | |
| keywords | Residual stresses | |
| keywords | Stress | |
| keywords | Computation | |
| keywords | Cooling | |
| keywords | Engineering simulation | |
| keywords | Electrodes AND Finite element analysis | |
| tree | Journal of Electronic Packaging:;2003:;volume( 125 ):;issue: 004 | |
| contenttype | Fulltext | |