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    Residual Stresses in Multilayer Ceramic Capacitors: Measurement and Computation

    Source: Journal of Electronic Packaging:;2003:;volume( 125 ):;issue: 004::page 506
    Author:
    Jaap M. J. den Toonder
    ,
    Christian W. Rademaker
    ,
    Ching-Li Hu
    DOI: 10.1115/1.1604151
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: In this paper, we present a combined experimental and computational study of the thermomechanical reliability of multilayer ceramic capacitors (MLCC’s). We focus on residual stresses introduced into the components during the cooling down step of the sintering process. The technique of microindentation turned out to be a useful method to measure the stresses locally. The computations were done with three-dimensional finite element simulations. We find that the cooling step introduces compressive in-plane stresses in the ceramic layers. There is reasonably good overall agreement between the residual stresses obtained from the indentation experiments and the numerical simulations. Some discrepancies do exist, though, for measurements on cross-sectioned MLCC’s. Possible reasons for the differences are discussed.
    keyword(s): Ceramics , Measurement , Computer simulation , Sintering , Residual stresses , Stress , Computation , Cooling , Engineering simulation , Electrodes AND Finite element analysis ,
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      Residual Stresses in Multilayer Ceramic Capacitors: Measurement and Computation

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    http://yetl.yabesh.ir/yetl1/handle/yetl/128170
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    contributor authorJaap M. J. den Toonder
    contributor authorChristian W. Rademaker
    contributor authorChing-Li Hu
    date accessioned2017-05-09T00:09:50Z
    date available2017-05-09T00:09:50Z
    date copyrightDecember, 2003
    date issued2003
    identifier issn1528-9044
    identifier otherJEPAE4-26225#506_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/128170
    description abstractIn this paper, we present a combined experimental and computational study of the thermomechanical reliability of multilayer ceramic capacitors (MLCC’s). We focus on residual stresses introduced into the components during the cooling down step of the sintering process. The technique of microindentation turned out to be a useful method to measure the stresses locally. The computations were done with three-dimensional finite element simulations. We find that the cooling step introduces compressive in-plane stresses in the ceramic layers. There is reasonably good overall agreement between the residual stresses obtained from the indentation experiments and the numerical simulations. Some discrepancies do exist, though, for measurements on cross-sectioned MLCC’s. Possible reasons for the differences are discussed.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleResidual Stresses in Multilayer Ceramic Capacitors: Measurement and Computation
    typeJournal Paper
    journal volume125
    journal issue4
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.1604151
    journal fristpage506
    journal lastpage511
    identifier eissn1043-7398
    keywordsCeramics
    keywordsMeasurement
    keywordsComputer simulation
    keywordsSintering
    keywordsResidual stresses
    keywordsStress
    keywordsComputation
    keywordsCooling
    keywordsEngineering simulation
    keywordsElectrodes AND Finite element analysis
    treeJournal of Electronic Packaging:;2003:;volume( 125 ):;issue: 004
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
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