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contributor authorJaap M. J. den Toonder
contributor authorChristian W. Rademaker
contributor authorChing-Li Hu
date accessioned2017-05-09T00:09:50Z
date available2017-05-09T00:09:50Z
date copyrightDecember, 2003
date issued2003
identifier issn1528-9044
identifier otherJEPAE4-26225#506_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/128170
description abstractIn this paper, we present a combined experimental and computational study of the thermomechanical reliability of multilayer ceramic capacitors (MLCC’s). We focus on residual stresses introduced into the components during the cooling down step of the sintering process. The technique of microindentation turned out to be a useful method to measure the stresses locally. The computations were done with three-dimensional finite element simulations. We find that the cooling step introduces compressive in-plane stresses in the ceramic layers. There is reasonably good overall agreement between the residual stresses obtained from the indentation experiments and the numerical simulations. Some discrepancies do exist, though, for measurements on cross-sectioned MLCC’s. Possible reasons for the differences are discussed.
publisherThe American Society of Mechanical Engineers (ASME)
titleResidual Stresses in Multilayer Ceramic Capacitors: Measurement and Computation
typeJournal Paper
journal volume125
journal issue4
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.1604151
journal fristpage506
journal lastpage511
identifier eissn1043-7398
keywordsCeramics
keywordsMeasurement
keywordsComputer simulation
keywordsSintering
keywordsResidual stresses
keywordsStress
keywordsComputation
keywordsCooling
keywordsEngineering simulation
keywordsElectrodes AND Finite element analysis
treeJournal of Electronic Packaging:;2003:;volume( 125 ):;issue: 004
contenttypeFulltext


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