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    Thermal and Mechanical Simulation and Experiments in Micro-electronics and Microsystems

    Source: Journal of Electronic Packaging:;2003:;volume( 125 ):;issue: 004::page 465
    Author:
    L. J. Ernst
    ,
    Guest Editor
    ,
    G. Q. Zhang
    ,
    Guest Editor
    DOI: 10.1115/1.1634590
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: This special issue includes selected papers presented at the International Conference of Thermal and Mechanical Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), Paris, May 2001. The annual EuroSimE conference was initiated in 2000, as the only international conference focusing on mechanical, thermal and thermo-mechanical simulation and experiments in microelectronics and microsystems, with financial co-sponsorship from the EC, and technical co-sponsorship of IEEE-CPMT, in order to meet the growing needs and challenges in this rapidly progressing field.
    keyword(s): Microelectromechanical systems , Engineering simulation AND Microelectronic devices ,
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      Thermal and Mechanical Simulation and Experiments in Micro-electronics and Microsystems

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    http://yetl.yabesh.ir/yetl1/handle/yetl/128160
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    contributor authorL. J. Ernst
    contributor authorGuest Editor
    contributor authorG. Q. Zhang
    contributor authorGuest Editor
    date accessioned2017-05-09T00:09:49Z
    date available2017-05-09T00:09:49Z
    date copyrightDecember, 2003
    date issued2003
    identifier issn1528-9044
    identifier otherJEPAE4-26225#465_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/128160
    description abstractThis special issue includes selected papers presented at the International Conference of Thermal and Mechanical Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), Paris, May 2001. The annual EuroSimE conference was initiated in 2000, as the only international conference focusing on mechanical, thermal and thermo-mechanical simulation and experiments in microelectronics and microsystems, with financial co-sponsorship from the EC, and technical co-sponsorship of IEEE-CPMT, in order to meet the growing needs and challenges in this rapidly progressing field.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleThermal and Mechanical Simulation and Experiments in Micro-electronics and Microsystems
    typeJournal Paper
    journal volume125
    journal issue4
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.1634590
    journal fristpage465
    identifier eissn1043-7398
    keywordsMicroelectromechanical systems
    keywordsEngineering simulation AND Microelectronic devices
    treeJournal of Electronic Packaging:;2003:;volume( 125 ):;issue: 004
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
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