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    Micro-Mechanics of Creep-Fatigue Damage in PB-SN Solder Due to Thermal Cycling—Part II: Mechanistic Insights and Cyclic Durability Predictions From Monotonic Data

    Source: Journal of Electronic Packaging:;2002:;volume( 124 ):;issue: 003::page 298
    Author:
    Pradeep Sharma
    ,
    Abhijit Dasgupta
    DOI: 10.1115/1.1493203
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: This paper illustrates the micromechanics approach to cyclic creep-fatigue damage of Pb-Sn, developed by the authors with the help of a simple case study. It is demonstrated that durability predictions can be made based solely on monotonic test data. Various parametric studies of practical interest are conducted to obtain mechanistic insights into various aspects of damage in solders e.g., effect of hydrostatic stresses, grain size, ramp rate, etc.
    keyword(s): Creep , Fatigue , Solders , Stress , Micromechanics (Engineering) , Durability , Cycles , Failure AND Hydrostatics ,
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      Micro-Mechanics of Creep-Fatigue Damage in PB-SN Solder Due to Thermal Cycling—Part II: Mechanistic Insights and Cyclic Durability Predictions From Monotonic Data

    URI
    http://yetl.yabesh.ir/yetl1/handle/yetl/126598
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    contributor authorPradeep Sharma
    contributor authorAbhijit Dasgupta
    date accessioned2017-05-09T00:07:10Z
    date available2017-05-09T00:07:10Z
    date copyrightSeptember, 2002
    date issued2002
    identifier issn1528-9044
    identifier otherJEPAE4-26206#298_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/126598
    description abstractThis paper illustrates the micromechanics approach to cyclic creep-fatigue damage of Pb-Sn, developed by the authors with the help of a simple case study. It is demonstrated that durability predictions can be made based solely on monotonic test data. Various parametric studies of practical interest are conducted to obtain mechanistic insights into various aspects of damage in solders e.g., effect of hydrostatic stresses, grain size, ramp rate, etc.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleMicro-Mechanics of Creep-Fatigue Damage in PB-SN Solder Due to Thermal Cycling—Part II: Mechanistic Insights and Cyclic Durability Predictions From Monotonic Data
    typeJournal Paper
    journal volume124
    journal issue3
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.1493203
    journal fristpage298
    journal lastpage304
    identifier eissn1043-7398
    keywordsCreep
    keywordsFatigue
    keywordsSolders
    keywordsStress
    keywordsMicromechanics (Engineering)
    keywordsDurability
    keywordsCycles
    keywordsFailure AND Hydrostatics
    treeJournal of Electronic Packaging:;2002:;volume( 124 ):;issue: 003
    contenttypeFulltext
    DSpace software copyright © 2002-2015  DuraSpace
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    yabeshDSpacePersian
     
    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
    yabeshDSpacePersian