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contributor authorPradeep Sharma
contributor authorAbhijit Dasgupta
date accessioned2017-05-09T00:07:10Z
date available2017-05-09T00:07:10Z
date copyrightSeptember, 2002
date issued2002
identifier issn1528-9044
identifier otherJEPAE4-26206#298_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/126598
description abstractThis paper illustrates the micromechanics approach to cyclic creep-fatigue damage of Pb-Sn, developed by the authors with the help of a simple case study. It is demonstrated that durability predictions can be made based solely on monotonic test data. Various parametric studies of practical interest are conducted to obtain mechanistic insights into various aspects of damage in solders e.g., effect of hydrostatic stresses, grain size, ramp rate, etc.
publisherThe American Society of Mechanical Engineers (ASME)
titleMicro-Mechanics of Creep-Fatigue Damage in PB-SN Solder Due to Thermal Cycling—Part II: Mechanistic Insights and Cyclic Durability Predictions From Monotonic Data
typeJournal Paper
journal volume124
journal issue3
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.1493203
journal fristpage298
journal lastpage304
identifier eissn1043-7398
keywordsCreep
keywordsFatigue
keywordsSolders
keywordsStress
keywordsMicromechanics (Engineering)
keywordsDurability
keywordsCycles
keywordsFailure AND Hydrostatics
treeJournal of Electronic Packaging:;2002:;volume( 124 ):;issue: 003
contenttypeFulltext


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