| contributor author | Pradeep Sharma | |
| contributor author | Abhijit Dasgupta | |
| date accessioned | 2017-05-09T00:07:10Z | |
| date available | 2017-05-09T00:07:10Z | |
| date copyright | September, 2002 | |
| date issued | 2002 | |
| identifier issn | 1528-9044 | |
| identifier other | JEPAE4-26206#298_1.pdf | |
| identifier uri | http://yetl.yabesh.ir/yetl/handle/yetl/126598 | |
| description abstract | This paper illustrates the micromechanics approach to cyclic creep-fatigue damage of Pb-Sn, developed by the authors with the help of a simple case study. It is demonstrated that durability predictions can be made based solely on monotonic test data. Various parametric studies of practical interest are conducted to obtain mechanistic insights into various aspects of damage in solders e.g., effect of hydrostatic stresses, grain size, ramp rate, etc. | |
| publisher | The American Society of Mechanical Engineers (ASME) | |
| title | Micro-Mechanics of Creep-Fatigue Damage in PB-SN Solder Due to Thermal Cycling—Part II: Mechanistic Insights and Cyclic Durability Predictions From Monotonic Data | |
| type | Journal Paper | |
| journal volume | 124 | |
| journal issue | 3 | |
| journal title | Journal of Electronic Packaging | |
| identifier doi | 10.1115/1.1493203 | |
| journal fristpage | 298 | |
| journal lastpage | 304 | |
| identifier eissn | 1043-7398 | |
| keywords | Creep | |
| keywords | Fatigue | |
| keywords | Solders | |
| keywords | Stress | |
| keywords | Micromechanics (Engineering) | |
| keywords | Durability | |
| keywords | Cycles | |
| keywords | Failure AND Hydrostatics | |
| tree | Journal of Electronic Packaging:;2002:;volume( 124 ):;issue: 003 | |
| contenttype | Fulltext | |