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    Integrated Flow Analysis During Filling and Post-Filling Stage of Semiconductor Encapsulation

    Source: Journal of Electronic Packaging:;2000:;volume( 122 ):;issue: 001::page 20
    Author:
    Sejin Han
    ,
    K. K. Wang
    DOI: 10.1115/1.483127
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: In this paper, flow during the filling and post-filling stages in semiconductor chip encapsulation has been analyzed. A finite-element method based on the Hele-Shaw approximation is used for the flow analysis in the chip cavity. The compressibility of the epoxy-molding compound has been considered to analyze the post-filling stage. The model has been verified by comparing resulting predictions with experimental results. Specifically, pressure has been measured in a rectangular cavity and compared with simulation results. The calculated and experimental results show good agreement. [S1043-7398(00)00101-8]
    keyword(s): Flow (Dynamics) , Temperature , Semiconductors (Materials) , Viscosity , Packing (Shipments) , Molding , Pressure , Cavities , Equations , Compressibility , Epoxy adhesives , Approximation , Density AND Curing ,
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      Integrated Flow Analysis During Filling and Post-Filling Stage of Semiconductor Encapsulation

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    http://yetl.yabesh.ir/yetl1/handle/yetl/123572
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    contributor authorSejin Han
    contributor authorK. K. Wang
    date accessioned2017-05-09T00:02:13Z
    date available2017-05-09T00:02:13Z
    date copyrightMarch, 2000
    date issued2000
    identifier issn1528-9044
    identifier otherJEPAE4-26178#20_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/123572
    description abstractIn this paper, flow during the filling and post-filling stages in semiconductor chip encapsulation has been analyzed. A finite-element method based on the Hele-Shaw approximation is used for the flow analysis in the chip cavity. The compressibility of the epoxy-molding compound has been considered to analyze the post-filling stage. The model has been verified by comparing resulting predictions with experimental results. Specifically, pressure has been measured in a rectangular cavity and compared with simulation results. The calculated and experimental results show good agreement. [S1043-7398(00)00101-8]
    publisherThe American Society of Mechanical Engineers (ASME)
    titleIntegrated Flow Analysis During Filling and Post-Filling Stage of Semiconductor Encapsulation
    typeJournal Paper
    journal volume122
    journal issue1
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.483127
    journal fristpage20
    journal lastpage27
    identifier eissn1043-7398
    keywordsFlow (Dynamics)
    keywordsTemperature
    keywordsSemiconductors (Materials)
    keywordsViscosity
    keywordsPacking (Shipments)
    keywordsMolding
    keywordsPressure
    keywordsCavities
    keywordsEquations
    keywordsCompressibility
    keywordsEpoxy adhesives
    keywordsApproximation
    keywordsDensity AND Curing
    treeJournal of Electronic Packaging:;2000:;volume( 122 ):;issue: 001
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
    yabeshDSpacePersian