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contributor authorSejin Han
contributor authorK. K. Wang
date accessioned2017-05-09T00:02:13Z
date available2017-05-09T00:02:13Z
date copyrightMarch, 2000
date issued2000
identifier issn1528-9044
identifier otherJEPAE4-26178#20_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/123572
description abstractIn this paper, flow during the filling and post-filling stages in semiconductor chip encapsulation has been analyzed. A finite-element method based on the Hele-Shaw approximation is used for the flow analysis in the chip cavity. The compressibility of the epoxy-molding compound has been considered to analyze the post-filling stage. The model has been verified by comparing resulting predictions with experimental results. Specifically, pressure has been measured in a rectangular cavity and compared with simulation results. The calculated and experimental results show good agreement. [S1043-7398(00)00101-8]
publisherThe American Society of Mechanical Engineers (ASME)
titleIntegrated Flow Analysis During Filling and Post-Filling Stage of Semiconductor Encapsulation
typeJournal Paper
journal volume122
journal issue1
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.483127
journal fristpage20
journal lastpage27
identifier eissn1043-7398
keywordsFlow (Dynamics)
keywordsTemperature
keywordsSemiconductors (Materials)
keywordsViscosity
keywordsPacking (Shipments)
keywordsMolding
keywordsPressure
keywordsCavities
keywordsEquations
keywordsCompressibility
keywordsEpoxy adhesives
keywordsApproximation
keywordsDensity AND Curing
treeJournal of Electronic Packaging:;2000:;volume( 122 ):;issue: 001
contenttypeFulltext


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