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    Nonlinear Dynamic Analysis of Surface Mount Interconnects: Part I—Theory

    Source: Journal of Electronic Packaging:;1999:;volume( 121 ):;issue: 001::page 8
    Author:
    C. Basaran
    ,
    R. Chandaroy
    DOI: 10.1115/1.2792663
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Solder joints are commonly used in surface mount technology microelectronics packaging. It is well known that the dominant failure mode for solder joints is thermal fatigue. When semiconductor devices are used in a vibrating environment, such as in automotive and military applications, dynamic stresses contribute to the failure mechanism and in certain circumstances they can become the dominant failure cause. In this paper a unified constitutive model for Pb40/Sn60 solder joints is developed and then implemented in a finite element dynamic analysis procedure. The purpose of the material model and the implementation is to study the contribution of vibration induced strains to the fatigue life of solder interconnects in low cycle and high cycle fatigue. The proposed material model, which is based on the disturbed state concept (DSC), is used for a dynamic analysis of a solder joint in the following paper, Part II, Basaran and Chandaroy (1998).
    keyword(s): Dynamic analysis , Surface mount packaging , Solder joints , Cycles , Failure , Fatigue , Semiconductors (Materials) , Solders , Microelectronic packaging , Stress , Constitutive equations , Failure mechanisms , Finite element analysis , Vibration , Fatigue life , Defense industry AND Surface mount technology ,
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      Nonlinear Dynamic Analysis of Surface Mount Interconnects: Part I—Theory

    URI
    http://yetl.yabesh.ir/yetl1/handle/yetl/122018
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    • Journal of Electronic Packaging

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    contributor authorC. Basaran
    contributor authorR. Chandaroy
    date accessioned2017-05-08T23:59:23Z
    date available2017-05-08T23:59:23Z
    date copyrightMarch, 1999
    date issued1999
    identifier issn1528-9044
    identifier otherJEPAE4-26171#8_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/122018
    description abstractSolder joints are commonly used in surface mount technology microelectronics packaging. It is well known that the dominant failure mode for solder joints is thermal fatigue. When semiconductor devices are used in a vibrating environment, such as in automotive and military applications, dynamic stresses contribute to the failure mechanism and in certain circumstances they can become the dominant failure cause. In this paper a unified constitutive model for Pb40/Sn60 solder joints is developed and then implemented in a finite element dynamic analysis procedure. The purpose of the material model and the implementation is to study the contribution of vibration induced strains to the fatigue life of solder interconnects in low cycle and high cycle fatigue. The proposed material model, which is based on the disturbed state concept (DSC), is used for a dynamic analysis of a solder joint in the following paper, Part II, Basaran and Chandaroy (1998).
    publisherThe American Society of Mechanical Engineers (ASME)
    titleNonlinear Dynamic Analysis of Surface Mount Interconnects: Part I—Theory
    typeJournal Paper
    journal volume121
    journal issue1
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.2792663
    journal fristpage8
    journal lastpage11
    identifier eissn1043-7398
    keywordsDynamic analysis
    keywordsSurface mount packaging
    keywordsSolder joints
    keywordsCycles
    keywordsFailure
    keywordsFatigue
    keywordsSemiconductors (Materials)
    keywordsSolders
    keywordsMicroelectronic packaging
    keywordsStress
    keywordsConstitutive equations
    keywordsFailure mechanisms
    keywordsFinite element analysis
    keywordsVibration
    keywordsFatigue life
    keywordsDefense industry AND Surface mount technology
    treeJournal of Electronic Packaging:;1999:;volume( 121 ):;issue: 001
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
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