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contributor authorC. Basaran
contributor authorR. Chandaroy
date accessioned2017-05-08T23:59:23Z
date available2017-05-08T23:59:23Z
date copyrightMarch, 1999
date issued1999
identifier issn1528-9044
identifier otherJEPAE4-26171#8_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/122018
description abstractSolder joints are commonly used in surface mount technology microelectronics packaging. It is well known that the dominant failure mode for solder joints is thermal fatigue. When semiconductor devices are used in a vibrating environment, such as in automotive and military applications, dynamic stresses contribute to the failure mechanism and in certain circumstances they can become the dominant failure cause. In this paper a unified constitutive model for Pb40/Sn60 solder joints is developed and then implemented in a finite element dynamic analysis procedure. The purpose of the material model and the implementation is to study the contribution of vibration induced strains to the fatigue life of solder interconnects in low cycle and high cycle fatigue. The proposed material model, which is based on the disturbed state concept (DSC), is used for a dynamic analysis of a solder joint in the following paper, Part II, Basaran and Chandaroy (1998).
publisherThe American Society of Mechanical Engineers (ASME)
titleNonlinear Dynamic Analysis of Surface Mount Interconnects: Part I—Theory
typeJournal Paper
journal volume121
journal issue1
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.2792663
journal fristpage8
journal lastpage11
identifier eissn1043-7398
keywordsDynamic analysis
keywordsSurface mount packaging
keywordsSolder joints
keywordsCycles
keywordsFailure
keywordsFatigue
keywordsSemiconductors (Materials)
keywordsSolders
keywordsMicroelectronic packaging
keywordsStress
keywordsConstitutive equations
keywordsFailure mechanisms
keywordsFinite element analysis
keywordsVibration
keywordsFatigue life
keywordsDefense industry AND Surface mount technology
treeJournal of Electronic Packaging:;1999:;volume( 121 ):;issue: 001
contenttypeFulltext


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