| contributor author | C. Basaran | |
| contributor author | R. Chandaroy | |
| date accessioned | 2017-05-08T23:59:23Z | |
| date available | 2017-05-08T23:59:23Z | |
| date copyright | March, 1999 | |
| date issued | 1999 | |
| identifier issn | 1528-9044 | |
| identifier other | JEPAE4-26171#8_1.pdf | |
| identifier uri | http://yetl.yabesh.ir/yetl/handle/yetl/122018 | |
| description abstract | Solder joints are commonly used in surface mount technology microelectronics packaging. It is well known that the dominant failure mode for solder joints is thermal fatigue. When semiconductor devices are used in a vibrating environment, such as in automotive and military applications, dynamic stresses contribute to the failure mechanism and in certain circumstances they can become the dominant failure cause. In this paper a unified constitutive model for Pb40/Sn60 solder joints is developed and then implemented in a finite element dynamic analysis procedure. The purpose of the material model and the implementation is to study the contribution of vibration induced strains to the fatigue life of solder interconnects in low cycle and high cycle fatigue. The proposed material model, which is based on the disturbed state concept (DSC), is used for a dynamic analysis of a solder joint in the following paper, Part II, Basaran and Chandaroy (1998). | |
| publisher | The American Society of Mechanical Engineers (ASME) | |
| title | Nonlinear Dynamic Analysis of Surface Mount Interconnects: Part I—Theory | |
| type | Journal Paper | |
| journal volume | 121 | |
| journal issue | 1 | |
| journal title | Journal of Electronic Packaging | |
| identifier doi | 10.1115/1.2792663 | |
| journal fristpage | 8 | |
| journal lastpage | 11 | |
| identifier eissn | 1043-7398 | |
| keywords | Dynamic analysis | |
| keywords | Surface mount packaging | |
| keywords | Solder joints | |
| keywords | Cycles | |
| keywords | Failure | |
| keywords | Fatigue | |
| keywords | Semiconductors (Materials) | |
| keywords | Solders | |
| keywords | Microelectronic packaging | |
| keywords | Stress | |
| keywords | Constitutive equations | |
| keywords | Failure mechanisms | |
| keywords | Finite element analysis | |
| keywords | Vibration | |
| keywords | Fatigue life | |
| keywords | Defense industry AND Surface mount technology | |
| tree | Journal of Electronic Packaging:;1999:;volume( 121 ):;issue: 001 | |
| contenttype | Fulltext | |