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    A Finite Element Procedure of a Cyclic Thermoviscoplasticity Model for Solder and Copper Interconnects

    Source: Journal of Electronic Packaging:;1998:;volume( 120 ):;issue: 001::page 24
    Author:
    C. Fu
    ,
    D. L. McDowell
    ,
    I. C. Ume
    DOI: 10.1115/1.2792281
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: A finite element procedure using a semi-implicit time-integration scheme has been developed for a cyclic thermoviscoplastic constitutive model for Pb-Sn solder and OFHC copper, two common metallic constituents in electronic packaging applications. The scheme has been implemented in the commercial finite element (FE) code ABAQUS (1995) via the user-defined material subroutine, UMAT. Several single-element simulations are conducted to compare with previous test results, which include monotonic tensile tests, creep tests, and a two-step ratchetting test for 62Sn36Pb2Ag solder; a nonproportional axial-torsional test and a thermomechanical fatigue (TMF) test for OFHC copper. At the constitutive level, we also provide an adaptive time stepping algorithm, which can be used to improve the overall computation efficiency and accuracy especially in large-scale FE analyses. We also compare the computational efforts of fully backward Euler and the proposed methods. The implementation of the FE procedure provides a guideline to apply user-defined material constitutive relations in FE analyses and to perform more sophisticated thermomechanical simulations. Such work can facilitate enhanced understanding thermomechanical reliability issue of solder and copper interconnects in electronic packaging applications.
    keyword(s): Copper , Solders , Finite element analysis , Electronic packaging , Constitutive equations , Engineering simulation , Algorithms , Reliability , Creep , Fatigue AND Computation ,
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      A Finite Element Procedure of a Cyclic Thermoviscoplasticity Model for Solder and Copper Interconnects

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    http://yetl.yabesh.ir/yetl1/handle/yetl/120284
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    contributor authorC. Fu
    contributor authorD. L. McDowell
    contributor authorI. C. Ume
    date accessioned2017-05-08T23:56:19Z
    date available2017-05-08T23:56:19Z
    date copyrightMarch, 1998
    date issued1998
    identifier issn1528-9044
    identifier otherJEPAE4-26165#24_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/120284
    description abstractA finite element procedure using a semi-implicit time-integration scheme has been developed for a cyclic thermoviscoplastic constitutive model for Pb-Sn solder and OFHC copper, two common metallic constituents in electronic packaging applications. The scheme has been implemented in the commercial finite element (FE) code ABAQUS (1995) via the user-defined material subroutine, UMAT. Several single-element simulations are conducted to compare with previous test results, which include monotonic tensile tests, creep tests, and a two-step ratchetting test for 62Sn36Pb2Ag solder; a nonproportional axial-torsional test and a thermomechanical fatigue (TMF) test for OFHC copper. At the constitutive level, we also provide an adaptive time stepping algorithm, which can be used to improve the overall computation efficiency and accuracy especially in large-scale FE analyses. We also compare the computational efforts of fully backward Euler and the proposed methods. The implementation of the FE procedure provides a guideline to apply user-defined material constitutive relations in FE analyses and to perform more sophisticated thermomechanical simulations. Such work can facilitate enhanced understanding thermomechanical reliability issue of solder and copper interconnects in electronic packaging applications.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleA Finite Element Procedure of a Cyclic Thermoviscoplasticity Model for Solder and Copper Interconnects
    typeJournal Paper
    journal volume120
    journal issue1
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.2792281
    journal fristpage24
    journal lastpage34
    identifier eissn1043-7398
    keywordsCopper
    keywordsSolders
    keywordsFinite element analysis
    keywordsElectronic packaging
    keywordsConstitutive equations
    keywordsEngineering simulation
    keywordsAlgorithms
    keywordsReliability
    keywordsCreep
    keywordsFatigue AND Computation
    treeJournal of Electronic Packaging:;1998:;volume( 120 ):;issue: 001
    contenttypeFulltext
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