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contributor authorC. Fu
contributor authorD. L. McDowell
contributor authorI. C. Ume
date accessioned2017-05-08T23:56:19Z
date available2017-05-08T23:56:19Z
date copyrightMarch, 1998
date issued1998
identifier issn1528-9044
identifier otherJEPAE4-26165#24_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/120284
description abstractA finite element procedure using a semi-implicit time-integration scheme has been developed for a cyclic thermoviscoplastic constitutive model for Pb-Sn solder and OFHC copper, two common metallic constituents in electronic packaging applications. The scheme has been implemented in the commercial finite element (FE) code ABAQUS (1995) via the user-defined material subroutine, UMAT. Several single-element simulations are conducted to compare with previous test results, which include monotonic tensile tests, creep tests, and a two-step ratchetting test for 62Sn36Pb2Ag solder; a nonproportional axial-torsional test and a thermomechanical fatigue (TMF) test for OFHC copper. At the constitutive level, we also provide an adaptive time stepping algorithm, which can be used to improve the overall computation efficiency and accuracy especially in large-scale FE analyses. We also compare the computational efforts of fully backward Euler and the proposed methods. The implementation of the FE procedure provides a guideline to apply user-defined material constitutive relations in FE analyses and to perform more sophisticated thermomechanical simulations. Such work can facilitate enhanced understanding thermomechanical reliability issue of solder and copper interconnects in electronic packaging applications.
publisherThe American Society of Mechanical Engineers (ASME)
titleA Finite Element Procedure of a Cyclic Thermoviscoplasticity Model for Solder and Copper Interconnects
typeJournal Paper
journal volume120
journal issue1
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.2792281
journal fristpage24
journal lastpage34
identifier eissn1043-7398
keywordsCopper
keywordsSolders
keywordsFinite element analysis
keywordsElectronic packaging
keywordsConstitutive equations
keywordsEngineering simulation
keywordsAlgorithms
keywordsReliability
keywordsCreep
keywordsFatigue AND Computation
treeJournal of Electronic Packaging:;1998:;volume( 120 ):;issue: 001
contenttypeFulltext


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