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    Evaluation of Elasto-Plastic Interfacial Fracture Parameters in Solder-Copper Bimaterial Using Moiré Interferometry

    Source: Journal of Electronic Packaging:;1998:;volume( 120 ):;issue: 003::page 267
    Author:
    H. Krishnamoorthy
    ,
    H. V. Tippur
    DOI: 10.1115/1.2792632
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: An experimental investigation dealing with failure characterization of 63/37 solder-copper interfaces is presented. The method of moiré interferometry is used for mapping elasto-plastic deformations in bimaterials subjected to predominantly tensile loading. A method for quantifying the fracture parameter—the J-integral—using full-field measurement of crack opening displacements has been developed. A linear relationship between crack tip opening displacements (CTOD) and the J-integral is demonstrated. The crack growth resistance curve and hence crack initiation toughness Jc value for the bimaterial is obtained. Full-field optical information has also suggested the possibility of using a simpler method for the J-integral estimation using a single strain gage for fracture testing of interfaces with large mismatch in this geometry.
    keyword(s): Copper , Interferometry , Solders , Fracture (Process) , Testing , Failure , Geometry , Strain gages , Toughness , Electrical resistance AND Deformation ,
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      Evaluation of Elasto-Plastic Interfacial Fracture Parameters in Solder-Copper Bimaterial Using Moiré Interferometry

    URI
    http://yetl.yabesh.ir/yetl1/handle/yetl/120249
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    • Journal of Electronic Packaging

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    contributor authorH. Krishnamoorthy
    contributor authorH. V. Tippur
    date accessioned2017-05-08T23:56:15Z
    date available2017-05-08T23:56:15Z
    date copyrightSeptember, 1998
    date issued1998
    identifier issn1528-9044
    identifier otherJEPAE4-26167#267_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/120249
    description abstractAn experimental investigation dealing with failure characterization of 63/37 solder-copper interfaces is presented. The method of moiré interferometry is used for mapping elasto-plastic deformations in bimaterials subjected to predominantly tensile loading. A method for quantifying the fracture parameter—the J-integral—using full-field measurement of crack opening displacements has been developed. A linear relationship between crack tip opening displacements (CTOD) and the J-integral is demonstrated. The crack growth resistance curve and hence crack initiation toughness Jc value for the bimaterial is obtained. Full-field optical information has also suggested the possibility of using a simpler method for the J-integral estimation using a single strain gage for fracture testing of interfaces with large mismatch in this geometry.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleEvaluation of Elasto-Plastic Interfacial Fracture Parameters in Solder-Copper Bimaterial Using Moiré Interferometry
    typeJournal Paper
    journal volume120
    journal issue3
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.2792632
    journal fristpage267
    journal lastpage274
    identifier eissn1043-7398
    keywordsCopper
    keywordsInterferometry
    keywordsSolders
    keywordsFracture (Process)
    keywordsTesting
    keywordsFailure
    keywordsGeometry
    keywordsStrain gages
    keywordsToughness
    keywordsElectrical resistance AND Deformation
    treeJournal of Electronic Packaging:;1998:;volume( 120 ):;issue: 003
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
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