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contributor authorH. Krishnamoorthy
contributor authorH. V. Tippur
date accessioned2017-05-08T23:56:15Z
date available2017-05-08T23:56:15Z
date copyrightSeptember, 1998
date issued1998
identifier issn1528-9044
identifier otherJEPAE4-26167#267_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/120249
description abstractAn experimental investigation dealing with failure characterization of 63/37 solder-copper interfaces is presented. The method of moiré interferometry is used for mapping elasto-plastic deformations in bimaterials subjected to predominantly tensile loading. A method for quantifying the fracture parameter—the J-integral—using full-field measurement of crack opening displacements has been developed. A linear relationship between crack tip opening displacements (CTOD) and the J-integral is demonstrated. The crack growth resistance curve and hence crack initiation toughness Jc value for the bimaterial is obtained. Full-field optical information has also suggested the possibility of using a simpler method for the J-integral estimation using a single strain gage for fracture testing of interfaces with large mismatch in this geometry.
publisherThe American Society of Mechanical Engineers (ASME)
titleEvaluation of Elasto-Plastic Interfacial Fracture Parameters in Solder-Copper Bimaterial Using Moiré Interferometry
typeJournal Paper
journal volume120
journal issue3
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.2792632
journal fristpage267
journal lastpage274
identifier eissn1043-7398
keywordsCopper
keywordsInterferometry
keywordsSolders
keywordsFracture (Process)
keywordsTesting
keywordsFailure
keywordsGeometry
keywordsStrain gages
keywordsToughness
keywordsElectrical resistance AND Deformation
treeJournal of Electronic Packaging:;1998:;volume( 120 ):;issue: 003
contenttypeFulltext


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