Stress Analysis and Thermal Characterization of a High Pin Count PQFPSource: Journal of Electronic Packaging:;1992:;volume( 114 ):;issue: 002::page 211Author:A. Mertol
DOI: 10.1115/1.2906420Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: A three-dimensional finite element model of a high pin count plastic-quad-flat-pack (PQFP) has been developed by using ANSYS™ finite element simulation code [1]. The model has been used for both thermo-mechanical stress analysis during temperature cycling and thermal characterization of the package under forced air cooling. Parametric studies have been performed on two different molding compounds with and without a drop-in heat spreader. In addition, the model has been simplified by substituting the leadframe and molding compound with a single homogeneous material, reflecting both molding compound and the leadframe thermo-physical properties. Results from the molding compound parametric studies indicate a lower package stress if the molding compound with low thermal expansion coefficient is used. Comparisons of principal and von Mises stresses show that the simplified model, overall, underpredicts the stresses. Although both the simplified and detailed models predict almost the same value for junction-to-case resistance (θJC ), calculated values are significantly lower than the measured θJC . In contrast to θJC , the predicted junction-to-ambient resistances (θJA ) are in good agreement with the measured data.
keyword(s): Stress analysis (Engineering) , Thermal characterization , Molding , Stress , Junctions , Flat heat pipes , Drops , Finite element analysis , Finite element model , Thermal expansion , Temperature , Cooling , Electrical resistance AND Simulation ,
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| contributor author | A. Mertol | |
| date accessioned | 2017-05-08T23:38:08Z | |
| date available | 2017-05-08T23:38:08Z | |
| date copyright | June, 1992 | |
| date issued | 1992 | |
| identifier issn | 1528-9044 | |
| identifier other | JEPAE4-26129#211_1.pdf | |
| identifier uri | http://yetl.yabesh.ir/yetl/handle/yetl/110078 | |
| description abstract | A three-dimensional finite element model of a high pin count plastic-quad-flat-pack (PQFP) has been developed by using ANSYS™ finite element simulation code [1]. The model has been used for both thermo-mechanical stress analysis during temperature cycling and thermal characterization of the package under forced air cooling. Parametric studies have been performed on two different molding compounds with and without a drop-in heat spreader. In addition, the model has been simplified by substituting the leadframe and molding compound with a single homogeneous material, reflecting both molding compound and the leadframe thermo-physical properties. Results from the molding compound parametric studies indicate a lower package stress if the molding compound with low thermal expansion coefficient is used. Comparisons of principal and von Mises stresses show that the simplified model, overall, underpredicts the stresses. Although both the simplified and detailed models predict almost the same value for junction-to-case resistance (θJC ), calculated values are significantly lower than the measured θJC . In contrast to θJC , the predicted junction-to-ambient resistances (θJA ) are in good agreement with the measured data. | |
| publisher | The American Society of Mechanical Engineers (ASME) | |
| title | Stress Analysis and Thermal Characterization of a High Pin Count PQFP | |
| type | Journal Paper | |
| journal volume | 114 | |
| journal issue | 2 | |
| journal title | Journal of Electronic Packaging | |
| identifier doi | 10.1115/1.2906420 | |
| journal fristpage | 211 | |
| journal lastpage | 220 | |
| identifier eissn | 1043-7398 | |
| keywords | Stress analysis (Engineering) | |
| keywords | Thermal characterization | |
| keywords | Molding | |
| keywords | Stress | |
| keywords | Junctions | |
| keywords | Flat heat pipes | |
| keywords | Drops | |
| keywords | Finite element analysis | |
| keywords | Finite element model | |
| keywords | Thermal expansion | |
| keywords | Temperature | |
| keywords | Cooling | |
| keywords | Electrical resistance AND Simulation | |
| tree | Journal of Electronic Packaging:;1992:;volume( 114 ):;issue: 002 | |
| contenttype | Fulltext |