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    Stress Analysis and Thermal Characterization of a High Pin Count PQFP

    Source: Journal of Electronic Packaging:;1992:;volume( 114 ):;issue: 002::page 211
    Author:
    A. Mertol
    DOI: 10.1115/1.2906420
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: A three-dimensional finite element model of a high pin count plastic-quad-flat-pack (PQFP) has been developed by using ANSYS™ finite element simulation code [1]. The model has been used for both thermo-mechanical stress analysis during temperature cycling and thermal characterization of the package under forced air cooling. Parametric studies have been performed on two different molding compounds with and without a drop-in heat spreader. In addition, the model has been simplified by substituting the leadframe and molding compound with a single homogeneous material, reflecting both molding compound and the leadframe thermo-physical properties. Results from the molding compound parametric studies indicate a lower package stress if the molding compound with low thermal expansion coefficient is used. Comparisons of principal and von Mises stresses show that the simplified model, overall, underpredicts the stresses. Although both the simplified and detailed models predict almost the same value for junction-to-case resistance (θJC ), calculated values are significantly lower than the measured θJC . In contrast to θJC , the predicted junction-to-ambient resistances (θJA ) are in good agreement with the measured data.
    keyword(s): Stress analysis (Engineering) , Thermal characterization , Molding , Stress , Junctions , Flat heat pipes , Drops , Finite element analysis , Finite element model , Thermal expansion , Temperature , Cooling , Electrical resistance AND Simulation ,
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      Stress Analysis and Thermal Characterization of a High Pin Count PQFP

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    http://yetl.yabesh.ir/yetl1/handle/yetl/110078
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    contributor authorA. Mertol
    date accessioned2017-05-08T23:38:08Z
    date available2017-05-08T23:38:08Z
    date copyrightJune, 1992
    date issued1992
    identifier issn1528-9044
    identifier otherJEPAE4-26129#211_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/110078
    description abstractA three-dimensional finite element model of a high pin count plastic-quad-flat-pack (PQFP) has been developed by using ANSYS™ finite element simulation code [1]. The model has been used for both thermo-mechanical stress analysis during temperature cycling and thermal characterization of the package under forced air cooling. Parametric studies have been performed on two different molding compounds with and without a drop-in heat spreader. In addition, the model has been simplified by substituting the leadframe and molding compound with a single homogeneous material, reflecting both molding compound and the leadframe thermo-physical properties. Results from the molding compound parametric studies indicate a lower package stress if the molding compound with low thermal expansion coefficient is used. Comparisons of principal and von Mises stresses show that the simplified model, overall, underpredicts the stresses. Although both the simplified and detailed models predict almost the same value for junction-to-case resistance (θJC ), calculated values are significantly lower than the measured θJC . In contrast to θJC , the predicted junction-to-ambient resistances (θJA ) are in good agreement with the measured data.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleStress Analysis and Thermal Characterization of a High Pin Count PQFP
    typeJournal Paper
    journal volume114
    journal issue2
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.2906420
    journal fristpage211
    journal lastpage220
    identifier eissn1043-7398
    keywordsStress analysis (Engineering)
    keywordsThermal characterization
    keywordsMolding
    keywordsStress
    keywordsJunctions
    keywordsFlat heat pipes
    keywordsDrops
    keywordsFinite element analysis
    keywordsFinite element model
    keywordsThermal expansion
    keywordsTemperature
    keywordsCooling
    keywordsElectrical resistance AND Simulation
    treeJournal of Electronic Packaging:;1992:;volume( 114 ):;issue: 002
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
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