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contributor authorA. Mertol
date accessioned2017-05-08T23:38:08Z
date available2017-05-08T23:38:08Z
date copyrightJune, 1992
date issued1992
identifier issn1528-9044
identifier otherJEPAE4-26129#211_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/110078
description abstractA three-dimensional finite element model of a high pin count plastic-quad-flat-pack (PQFP) has been developed by using ANSYS™ finite element simulation code [1]. The model has been used for both thermo-mechanical stress analysis during temperature cycling and thermal characterization of the package under forced air cooling. Parametric studies have been performed on two different molding compounds with and without a drop-in heat spreader. In addition, the model has been simplified by substituting the leadframe and molding compound with a single homogeneous material, reflecting both molding compound and the leadframe thermo-physical properties. Results from the molding compound parametric studies indicate a lower package stress if the molding compound with low thermal expansion coefficient is used. Comparisons of principal and von Mises stresses show that the simplified model, overall, underpredicts the stresses. Although both the simplified and detailed models predict almost the same value for junction-to-case resistance (θJC ), calculated values are significantly lower than the measured θJC . In contrast to θJC , the predicted junction-to-ambient resistances (θJA ) are in good agreement with the measured data.
publisherThe American Society of Mechanical Engineers (ASME)
titleStress Analysis and Thermal Characterization of a High Pin Count PQFP
typeJournal Paper
journal volume114
journal issue2
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.2906420
journal fristpage211
journal lastpage220
identifier eissn1043-7398
keywordsStress analysis (Engineering)
keywordsThermal characterization
keywordsMolding
keywordsStress
keywordsJunctions
keywordsFlat heat pipes
keywordsDrops
keywordsFinite element analysis
keywordsFinite element model
keywordsThermal expansion
keywordsTemperature
keywordsCooling
keywordsElectrical resistance AND Simulation
treeJournal of Electronic Packaging:;1992:;volume( 114 ):;issue: 002
contenttypeFulltext


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