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    Transient Thermal Stress Analysis of a Plated Through Hole Subjected to Wave Soldering

    Source: Journal of Electronic Packaging:;1991:;volume( 113 ):;issue: 002::page 149
    Author:
    D. Barker
    ,
    M. Pecht
    ,
    A. Dasgupta
    ,
    S. Naqvi
    DOI: 10.1115/1.2905380
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: During a typical wave soldering operation a plated through hole (PTH) is exposed to temperatures which are higher than any rated operating temperatures. Understanding the heat transfer and the potential PTH damage mechanisms, which arise during the wave soldering process, is critical to PTH quality control and reliability. In particular, cracks may be initiated during the wave soldering transient and become manifest only after operational cycling. This paper presents a transient nonlinear thermal stress analysis of a nonsolder filled PTH that is subjected to a typical wave soldering process. A full three-dimensional orthotropic analysis and an axisymmetric analysis with cylindrically anisotropic properties are used and the results compared. Temperature and stress/strain history curves are examined to determine the impact of the wave soldering operation on the PTH fatigue life. The effect of PWB innerplanes on the PTH maximum stress and strain is also investigated.
    keyword(s): Thermal stresses , Wave soldering , Stress , Temperature , Heat transfer , Quality control , Reliability , Fracture (Materials) , Fatigue life , Operating temperature , Printed circuit boards AND Mechanisms ,
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      Transient Thermal Stress Analysis of a Plated Through Hole Subjected to Wave Soldering

    URI
    http://yetl.yabesh.ir/yetl1/handle/yetl/108398
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    • Journal of Electronic Packaging

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    contributor authorD. Barker
    contributor authorM. Pecht
    contributor authorA. Dasgupta
    contributor authorS. Naqvi
    date accessioned2017-05-08T23:35:18Z
    date available2017-05-08T23:35:18Z
    date copyrightJune, 1991
    date issued1991
    identifier issn1528-9044
    identifier otherJEPAE4-26122#149_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/108398
    description abstractDuring a typical wave soldering operation a plated through hole (PTH) is exposed to temperatures which are higher than any rated operating temperatures. Understanding the heat transfer and the potential PTH damage mechanisms, which arise during the wave soldering process, is critical to PTH quality control and reliability. In particular, cracks may be initiated during the wave soldering transient and become manifest only after operational cycling. This paper presents a transient nonlinear thermal stress analysis of a nonsolder filled PTH that is subjected to a typical wave soldering process. A full three-dimensional orthotropic analysis and an axisymmetric analysis with cylindrically anisotropic properties are used and the results compared. Temperature and stress/strain history curves are examined to determine the impact of the wave soldering operation on the PTH fatigue life. The effect of PWB innerplanes on the PTH maximum stress and strain is also investigated.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleTransient Thermal Stress Analysis of a Plated Through Hole Subjected to Wave Soldering
    typeJournal Paper
    journal volume113
    journal issue2
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.2905380
    journal fristpage149
    journal lastpage155
    identifier eissn1043-7398
    keywordsThermal stresses
    keywordsWave soldering
    keywordsStress
    keywordsTemperature
    keywordsHeat transfer
    keywordsQuality control
    keywordsReliability
    keywordsFracture (Materials)
    keywordsFatigue life
    keywordsOperating temperature
    keywordsPrinted circuit boards AND Mechanisms
    treeJournal of Electronic Packaging:;1991:;volume( 113 ):;issue: 002
    contenttypeFulltext
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