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contributor authorD. Barker
contributor authorM. Pecht
contributor authorA. Dasgupta
contributor authorS. Naqvi
date accessioned2017-05-08T23:35:18Z
date available2017-05-08T23:35:18Z
date copyrightJune, 1991
date issued1991
identifier issn1528-9044
identifier otherJEPAE4-26122#149_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/108398
description abstractDuring a typical wave soldering operation a plated through hole (PTH) is exposed to temperatures which are higher than any rated operating temperatures. Understanding the heat transfer and the potential PTH damage mechanisms, which arise during the wave soldering process, is critical to PTH quality control and reliability. In particular, cracks may be initiated during the wave soldering transient and become manifest only after operational cycling. This paper presents a transient nonlinear thermal stress analysis of a nonsolder filled PTH that is subjected to a typical wave soldering process. A full three-dimensional orthotropic analysis and an axisymmetric analysis with cylindrically anisotropic properties are used and the results compared. Temperature and stress/strain history curves are examined to determine the impact of the wave soldering operation on the PTH fatigue life. The effect of PWB innerplanes on the PTH maximum stress and strain is also investigated.
publisherThe American Society of Mechanical Engineers (ASME)
titleTransient Thermal Stress Analysis of a Plated Through Hole Subjected to Wave Soldering
typeJournal Paper
journal volume113
journal issue2
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.2905380
journal fristpage149
journal lastpage155
identifier eissn1043-7398
keywordsThermal stresses
keywordsWave soldering
keywordsStress
keywordsTemperature
keywordsHeat transfer
keywordsQuality control
keywordsReliability
keywordsFracture (Materials)
keywordsFatigue life
keywordsOperating temperature
keywordsPrinted circuit boards AND Mechanisms
treeJournal of Electronic Packaging:;1991:;volume( 113 ):;issue: 002
contenttypeFulltext


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