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    Damage Boundary Curves: A Computational (FEM) Approach

    Source: Journal of Electronic Packaging:;1990:;volume( 112 ):;issue: 003::page 198
    Author:
    D. V. Caletka
    ,
    R. N. Caldwell
    ,
    J. T. Vogelmann
    DOI: 10.1115/1.2904367
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: As the mechanical, thermal, and electrical demands on 2nd and 3rd level electronic packages increase, so does the need for early dynamic analysis of the proposed design. Estimating effect of dynamic transients (shock inputs) is of primary concern and the current topic of discussion. The computational determination of a damage boundary curve/s (DBC) for a proposed 2nd/3rd level package may seem a formidable task. With the experienced use of the finite element method (FEM), engineering insight, and some relatively simple mechanical testing, the task can be reasonably accomplished. This is not to say that every failure mechanism can be foreseen, predicted or modeled, but some failures can be avoided during qualification testing. The proposed method of DBC determination requires some initial ideas related to where failures may occur due to transient inputs. Failures may include a given maximum stress level, strain, deflection of a particular point or the force at a riveted connection. These suspect areas of failure will tend to guide the modeling technique. Models must be constructed not only to address the specific areas of concern but also to reasonably represent the overall dynamics of the package. Examples of this technique will be presented, each with varying degrees of verification.
    keyword(s): Finite element methods , Finite element model , Failure , Mechanical testing , Electronic packages , Dynamics (Mechanics) , Force , Stress , Shock (Mechanics) , Design , Dynamic analysis , Failure mechanisms , Modeling , Testing AND Deflection ,
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      Damage Boundary Curves: A Computational (FEM) Approach

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    http://yetl.yabesh.ir/yetl1/handle/yetl/106759
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    contributor authorD. V. Caletka
    contributor authorR. N. Caldwell
    contributor authorJ. T. Vogelmann
    date accessioned2017-05-08T23:32:22Z
    date available2017-05-08T23:32:22Z
    date copyrightSeptember, 1990
    date issued1990
    identifier issn1528-9044
    identifier otherJEPAE4-26117#198_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/106759
    description abstractAs the mechanical, thermal, and electrical demands on 2nd and 3rd level electronic packages increase, so does the need for early dynamic analysis of the proposed design. Estimating effect of dynamic transients (shock inputs) is of primary concern and the current topic of discussion. The computational determination of a damage boundary curve/s (DBC) for a proposed 2nd/3rd level package may seem a formidable task. With the experienced use of the finite element method (FEM), engineering insight, and some relatively simple mechanical testing, the task can be reasonably accomplished. This is not to say that every failure mechanism can be foreseen, predicted or modeled, but some failures can be avoided during qualification testing. The proposed method of DBC determination requires some initial ideas related to where failures may occur due to transient inputs. Failures may include a given maximum stress level, strain, deflection of a particular point or the force at a riveted connection. These suspect areas of failure will tend to guide the modeling technique. Models must be constructed not only to address the specific areas of concern but also to reasonably represent the overall dynamics of the package. Examples of this technique will be presented, each with varying degrees of verification.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleDamage Boundary Curves: A Computational (FEM) Approach
    typeJournal Paper
    journal volume112
    journal issue3
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.2904367
    journal fristpage198
    journal lastpage203
    identifier eissn1043-7398
    keywordsFinite element methods
    keywordsFinite element model
    keywordsFailure
    keywordsMechanical testing
    keywordsElectronic packages
    keywordsDynamics (Mechanics)
    keywordsForce
    keywordsStress
    keywordsShock (Mechanics)
    keywordsDesign
    keywordsDynamic analysis
    keywordsFailure mechanisms
    keywordsModeling
    keywordsTesting AND Deflection
    treeJournal of Electronic Packaging:;1990:;volume( 112 ):;issue: 003
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
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